{"user_id":"55706","citation":{"chicago":"Pauly, Johannes, and Jörg Lindner. “TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography,” 2012.","short":"J. Pauly, J. Lindner, in: 2012.","apa":"Pauly, J., &#38; Lindner, J. (2012). TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. Presented at the E-MRS Fall Meeting 2012, Warsaw (Poland).","ama":"Pauly J, Lindner J. TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. In: ; 2012.","bibtex":"@inproceedings{Pauly_Lindner_2012, title={TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography}, author={Pauly, Johannes and Lindner, Jörg}, year={2012} }","mla":"Pauly, Johannes, and Jörg Lindner. <i>TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography</i>. 2012.","ieee":"J. Pauly and J. Lindner, “TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography,” presented at the E-MRS Fall Meeting 2012, Warsaw (Poland), 2012."},"date_created":"2018-08-27T12:17:43Z","_id":"4135","title":"TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography","department":[{"_id":"286"}],"author":[{"first_name":"Johannes","last_name":"Pauly","full_name":"Pauly, Johannes"},{"first_name":"Jörg","full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner"}],"status":"public","year":"2012","type":"conference","date_updated":"2022-01-06T07:00:23Z","conference":{"name":"E-MRS Fall Meeting 2012","start_date":"2012-09-17","end_date":"2012-09-21","location":"Warsaw (Poland)"},"language":[{"iso":"eng"}]}