{"conference":{"start_date":"2012-09-17","end_date":"2012-09-21","location":"Warsaw (Poland)","name":"E-MRS Fall Meeting 2012"},"author":[{"full_name":"Pauly, Johannes","last_name":"Pauly","first_name":"Johannes"},{"id":"20797","full_name":"Lindner, Jörg","first_name":"Jörg","last_name":"Lindner"}],"citation":{"ama":"Pauly J, Lindner J. TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. In: ; 2012.","mla":"Pauly, Johannes, and Jörg Lindner. <i>TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography</i>. 2012.","ieee":"J. Pauly and J. Lindner, “TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography,” presented at the E-MRS Fall Meeting 2012, Warsaw (Poland), 2012.","apa":"Pauly, J., &#38; Lindner, J. (2012). TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. Presented at the E-MRS Fall Meeting 2012, Warsaw (Poland).","short":"J. Pauly, J. Lindner, in: 2012.","chicago":"Pauly, Johannes, and Jörg Lindner. “TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography,” 2012.","bibtex":"@inproceedings{Pauly_Lindner_2012, title={TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography}, author={Pauly, Johannes and Lindner, Jörg}, year={2012} }"},"title":"TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography","type":"conference","date_updated":"2022-01-06T07:00:23Z","language":[{"iso":"eng"}],"user_id":"55706","department":[{"_id":"286"}],"year":"2012","_id":"4135","status":"public","date_created":"2018-08-27T12:17:43Z"}