{"publication":"IEEE Electromagnetic Compatibility Magazine","type":"journal_article","status":"public","department":[{"_id":"51"}],"user_id":"77496","_id":"41866","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Computer Networks and Communications","Instrumentation","Signal Processing","Software"],"issue":"3","publication_identifier":{"issn":["2162-2264","2162-2272"]},"publication_status":"published","page":"79-85","intvolume":"         4","citation":{"ama":"Russer JA, Uddin N, Awny AS, Thiede A, Russer P. Near-field measurement of stochastic electromagnetic fields. <i>IEEE Electromagnetic Compatibility Magazine</i>. 2015;4(3):79-85. doi:<a href=\"https://doi.org/10.1109/memc.2015.7336761\">10.1109/memc.2015.7336761</a>","chicago":"Russer, Johannes A., Nasir Uddin, Ahmed Sanaa Awny, Andreas Thiede, and Peter Russer. “Near-Field Measurement of Stochastic Electromagnetic Fields.” <i>IEEE Electromagnetic Compatibility Magazine</i> 4, no. 3 (2015): 79–85. <a href=\"https://doi.org/10.1109/memc.2015.7336761\">https://doi.org/10.1109/memc.2015.7336761</a>.","ieee":"J. A. Russer, N. Uddin, A. S. Awny, A. Thiede, and P. Russer, “Near-field measurement of stochastic electromagnetic fields,” <i>IEEE Electromagnetic Compatibility Magazine</i>, vol. 4, no. 3, pp. 79–85, 2015, doi: <a href=\"https://doi.org/10.1109/memc.2015.7336761\">10.1109/memc.2015.7336761</a>.","mla":"Russer, Johannes A., et al. “Near-Field Measurement of Stochastic Electromagnetic Fields.” <i>IEEE Electromagnetic Compatibility Magazine</i>, vol. 4, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2015, pp. 79–85, doi:<a href=\"https://doi.org/10.1109/memc.2015.7336761\">10.1109/memc.2015.7336761</a>.","bibtex":"@article{Russer_Uddin_Awny_Thiede_Russer_2015, title={Near-field measurement of stochastic electromagnetic fields}, volume={4}, DOI={<a href=\"https://doi.org/10.1109/memc.2015.7336761\">10.1109/memc.2015.7336761</a>}, number={3}, journal={IEEE Electromagnetic Compatibility Magazine}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Russer, Johannes A. and Uddin, Nasir and Awny, Ahmed Sanaa and Thiede, Andreas and Russer, Peter}, year={2015}, pages={79–85} }","short":"J.A. Russer, N. Uddin, A.S. Awny, A. Thiede, P. Russer, IEEE Electromagnetic Compatibility Magazine 4 (2015) 79–85.","apa":"Russer, J. A., Uddin, N., Awny, A. S., Thiede, A., &#38; Russer, P. (2015). Near-field measurement of stochastic electromagnetic fields. <i>IEEE Electromagnetic Compatibility Magazine</i>, <i>4</i>(3), 79–85. <a href=\"https://doi.org/10.1109/memc.2015.7336761\">https://doi.org/10.1109/memc.2015.7336761</a>"},"year":"2015","volume":4,"date_created":"2023-02-07T10:59:53Z","author":[{"full_name":"Russer, Johannes A.","last_name":"Russer","first_name":"Johannes A."},{"last_name":"Uddin","full_name":"Uddin, Nasir","first_name":"Nasir"},{"full_name":"Awny, Ahmed Sanaa","last_name":"Awny","first_name":"Ahmed Sanaa"},{"full_name":"Thiede, Andreas","id":"538","last_name":"Thiede","first_name":"Andreas"},{"full_name":"Russer, Peter","last_name":"Russer","first_name":"Peter"}],"date_updated":"2023-02-07T11:00:56Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","doi":"10.1109/memc.2015.7336761","title":"Near-field measurement of stochastic electromagnetic fields"}