{"conference":{"end_date":"2011-03-18","name":" 75. Annual meeting of the DPG and combined DPG Spring meeting ","location":"Dresden, Germany","start_date":"2011-03-13"},"abstract":[{"lang":"eng","text":"Optical two-dimensional Fourier transform spectroscopy has been used to study the properties of semiconductor nanostructures in four-wave-mixing like experiments. Applying a phenomenological level model, we numerically and analytically analyze the main features of excitonic and biexcitonic contributions in a semiconductor quantum well by solving the optical Bloch equations. The method is extended to three-dimensional Fourier transform spectroscopy to investigate a recent experiment."}],"title":"Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model","date_updated":"2023-05-01T12:46:10Z","issue":"1","intvolume":"        46","series_title":"Verhandlungen der Deutschen Physikalischen Gesellschaft","department":[{"_id":"293"}],"volume":46,"publication_identifier":{"issn":["0420-0195"]},"main_file_link":[{"url":"https://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/hl/session/85/contribution/28"}],"author":[{"orcid":"0000-0001-8864-2072","id":"344","first_name":"Torsten","last_name":"Meier","full_name":"Meier, Torsten"},{"first_name":"Christian","full_name":"Wiebeler, Christian","last_name":"Wiebeler"},{"last_name":"Reichelt","full_name":"Reichelt, Matthias","id":"138","first_name":"Matthias"}],"publication_status":"published","date_created":"2023-04-19T10:43:18Z","publication":" 75. Annual meeting of the DPG and combined DPG Spring meeting ","language":[{"iso":"eng"}],"type":"conference","citation":{"ieee":"T. Meier, C. Wiebeler, and M. Reichelt, “Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model,” in <i> 75. Annual meeting of the DPG and combined DPG Spring meeting </i>, Dresden, Germany, 2011, vol. 46, no. 1.","bibtex":"@inproceedings{Meier_Wiebeler_Reichelt_2011, series={Verhandlungen der Deutschen Physikalischen Gesellschaft}, title={Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model}, volume={46}, number={1}, booktitle={ 75. Annual meeting of the DPG and combined DPG Spring meeting }, author={Meier, Torsten and Wiebeler, Christian and Reichelt, Matthias}, year={2011}, collection={Verhandlungen der Deutschen Physikalischen Gesellschaft} }","ama":"Meier T, Wiebeler C, Reichelt M. Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model. In: <i> 75. Annual Meeting of the DPG and Combined DPG Spring Meeting </i>. Vol 46. Verhandlungen der Deutschen Physikalischen Gesellschaft. ; 2011.","short":"T. Meier, C. Wiebeler, M. Reichelt, in:  75. Annual Meeting of the DPG and Combined DPG Spring Meeting , 2011.","apa":"Meier, T., Wiebeler, C., &#38; Reichelt, M. (2011). Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model. <i> 75. Annual Meeting of the DPG and Combined DPG Spring Meeting </i>, <i>46</i>(1).","chicago":"Meier, Torsten, Christian Wiebeler, and Matthias Reichelt. “Analysis of Multidimensional Fourier Transform Spectroscopy for Semiconductors with a Phenomenological Level Model.” In <i> 75. Annual Meeting of the DPG and Combined DPG Spring Meeting </i>, Vol. 46. Verhandlungen Der Deutschen Physikalischen Gesellschaft, 2011.","mla":"Meier, Torsten, et al. “Analysis of Multidimensional Fourier Transform Spectroscopy for Semiconductors with a Phenomenological Level Model.” <i> 75. Annual Meeting of the DPG and Combined DPG Spring Meeting </i>, vol. 46, no. 1, 2011."},"user_id":"49063","year":"2011","status":"public","_id":"44062"}