{"title":"Robust Pattern Generation for Small Delay Faults under Process Variations","publication":"IEEE International Test Conference (ITC'23), Anaheim, USA, October 2023","conference":{"start_date":"2023-10-08","location":"Anaheim, USA","name":"IEEE International Test Conference (ITC'23)","end_date":"2023-10-13"},"place":"Anaheim, CA, USA","language":[{"iso":"eng"}],"date_updated":"2024-03-22T17:14:02Z","citation":{"apa":"Jafarzadeh, H., Klemme, F., Reimer, J. D., Najafi Haghi, Z. P.,  Amrouch, H., Hellebrand, S., &#38;  Wunderlich, H.-J. (2023). Robust Pattern Generation for Small Delay Faults under Process Variations. <i>IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023</i>. IEEE International Test Conference (ITC’23), Anaheim, USA.","mla":"Jafarzadeh, Hanieh, et al. “Robust Pattern Generation for Small Delay Faults under Process Variations.” <i>IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023</i>, IEEE, 2023.","chicago":"Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi Haghi, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim  Wunderlich. “Robust Pattern Generation for Small Delay Faults under Process Variations.” In <i>IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023</i>. Anaheim, CA, USA: IEEE, 2023.","bibtex":"@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim}, year={2023} }","ieee":"H. Jafarzadeh <i>et al.</i>, “Robust Pattern Generation for Small Delay Faults under Process Variations,” presented at the IEEE International Test Conference (ITC’23), Anaheim, USA, 2023.","ama":"Jafarzadeh H, Klemme F, Reimer JD, et al. Robust Pattern Generation for Small Delay Faults under Process Variations. In: <i>IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023</i>. IEEE; 2023.","short":"H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H.  Amrouch, S. Hellebrand, H.-J.  Wunderlich, in: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023."},"type":"conference","publisher":"IEEE","department":[{"_id":"48"}],"status":"public","_id":"45830","publication_status":"published","date_created":"2023-07-03T08:20:17Z","user_id":"209","author":[{"first_name":"Hanieh","full_name":"Jafarzadeh, Hanieh","last_name":"Jafarzadeh"},{"first_name":"Florian","full_name":"Klemme, Florian","last_name":"Klemme"},{"first_name":"Jan Dennis","id":"36703","full_name":"Reimer, Jan Dennis","last_name":"Reimer"},{"first_name":"Zahra Paria","full_name":"Najafi Haghi, Zahra Paria","last_name":"Najafi Haghi"},{"last_name":" Amrouch","full_name":" Amrouch, Hussam","first_name":"Hussam"},{"orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"full_name":" Wunderlich, Hans-Joachim","last_name":" Wunderlich","first_name":"Hans-Joachim"}],"year":"2023"}