{"language":[{"iso":"eng"}],"date_updated":"2023-08-02T11:32:48Z","title":"An off-line MDSI interconnect BIST incorporated in BS 1149.1","extern":"1","publication":"2014 19th IEEE European Test Symposium (ETS)","publication_status":"published","date_created":"2023-08-02T11:18:26Z","doi":"10.1109/ets.2014.6847847","status":"public","_id":"46268","user_id":"78614","author":[{"first_name":"Marzieh","last_name":"Mohammadi","full_name":"Mohammadi, Marzieh"},{"last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","id":"78614","first_name":"Somayeh","orcid":"https://orcid.org/0000-0001-7246-0610"},{"first_name":"Nasser","full_name":"Masoumi, Nasser","last_name":"Masoumi"},{"first_name":"Zainalabedin","last_name":"Navabi","full_name":"Navabi, Zainalabedin"}],"year":"2014","type":"conference","publisher":"IEEE","citation":{"ama":"Mohammadi M, Sadeghi-Kohan S, Masoumi N, Navabi Z. An off-line MDSI interconnect BIST incorporated in BS 1149.1. In: <i>2014 19th IEEE European Test Symposium (ETS)</i>. IEEE; 2014. doi:<a href=\"https://doi.org/10.1109/ets.2014.6847847\">10.1109/ets.2014.6847847</a>","ieee":"M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, and Z. Navabi, “An off-line MDSI interconnect BIST incorporated in BS 1149.1,” 2014, doi: <a href=\"https://doi.org/10.1109/ets.2014.6847847\">10.1109/ets.2014.6847847</a>.","bibtex":"@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line MDSI interconnect BIST incorporated in BS 1149.1}, DOI={<a href=\"https://doi.org/10.1109/ets.2014.6847847\">10.1109/ets.2014.6847847</a>}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}, year={2014} }","short":"M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.","apa":"Mohammadi, M., Sadeghi-Kohan, S., Masoumi, N., &#38; Navabi, Z. (2014). An off-line MDSI interconnect BIST incorporated in BS 1149.1. <i>2014 19th IEEE European Test Symposium (ETS)</i>. <a href=\"https://doi.org/10.1109/ets.2014.6847847\">https://doi.org/10.1109/ets.2014.6847847</a>","chicago":"Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” In <i>2014 19th IEEE European Test Symposium (ETS)</i>. IEEE, 2014. <a href=\"https://doi.org/10.1109/ets.2014.6847847\">https://doi.org/10.1109/ets.2014.6847847</a>.","mla":"Mohammadi, Marzieh, et al. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” <i>2014 19th IEEE European Test Symposium (ETS)</i>, IEEE, 2014, doi:<a href=\"https://doi.org/10.1109/ets.2014.6847847\">10.1109/ets.2014.6847847</a>."},"department":[{"_id":"48"}]}