{"date_updated":"2023-08-02T11:33:26Z","extern":"1","publisher":"IEEE","publication_status":"published","citation":{"bibtex":"@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }","ieee":"S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, and Z. Navabi, “BS 1149.1 extensions for an online interconnect fault detection and recovery,” 2013, doi: 10.1109/test.2012.6401583.","chicago":"Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” In 2012 IEEE International Test Conference. IEEE, 2013. https://doi.org/10.1109/test.2012.6401583.","short":"S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.","mla":"Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” 2012 IEEE International Test Conference, IEEE, 2013, doi:10.1109/test.2012.6401583.","apa":"Sadeghi-Kohan, S., Namaki-Shoushtari, M., Javaheri, F., & Navabi, Z. (2013). BS 1149.1 extensions for an online interconnect fault detection and recovery. 2012 IEEE International Test Conference. https://doi.org/10.1109/test.2012.6401583","ama":"Sadeghi-Kohan S, Namaki-Shoushtari M, Javaheri F, Navabi Z. BS 1149.1 extensions for an online interconnect fault detection and recovery. In: 2012 IEEE International Test Conference. IEEE; 2013. doi:10.1109/test.2012.6401583"},"year":"2013","language":[{"iso":"eng"}],"status":"public","doi":"10.1109/test.2012.6401583","_id":"46271","title":"BS 1149.1 extensions for an online interconnect fault detection and recovery","author":[{"orcid":"https://orcid.org/0000-0001-7246-0610","last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","id":"78614","first_name":"Somayeh"},{"full_name":"Namaki-Shoushtari, Majid","last_name":"Namaki-Shoushtari","first_name":"Majid"},{"full_name":"Javaheri, Fatemeh","last_name":"Javaheri","first_name":"Fatemeh"},{"last_name":"Navabi","full_name":"Navabi, Zainalabedin","first_name":"Zainalabedin"}],"department":[{"_id":"48"}],"type":"conference","publication":"2012 IEEE International Test Conference","date_created":"2023-08-02T11:20:19Z","user_id":"78614"}