{"language":[{"iso":"eng"}],"citation":{"apa":"Kamran, A., Nemati, N., Sadeghi-Kohan, S., &#38; Navabi, Z. (2011). Virtual tester development using HDL/PLI. <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">https://doi.org/10.1109/ewdts.2010.5742156</a>","mla":"Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.” <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>.","ama":"Kamran A, Nemati N, Sadeghi-Kohan S, Navabi Z. Virtual tester development using HDL/PLI. In: <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>","short":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, Z. Navabi, in: 2010 East-West Design &#38;amp; Test Symposium (EWDTS), IEEE, 2011.","chicago":"Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">https://doi.org/10.1109/ewdts.2010.5742156</a>.","ieee":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, and Z. Navabi, “Virtual tester development using HDL/PLI,” 2011, doi: <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>.","bibtex":"@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>}, booktitle={2010 East-West Design &#38;amp; Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }"},"date_updated":"2023-08-02T11:33:46Z","year":"2011","title":"Virtual tester development using HDL/PLI","type":"conference","status":"public","_id":"46272","extern":"1","date_created":"2023-08-02T11:21:02Z","publication":"2010 East-West Design &amp; Test Symposium (EWDTS)","department":[{"_id":"48"}],"publisher":"IEEE","author":[{"last_name":"Kamran","first_name":"Arezoo","full_name":"Kamran, Arezoo"},{"first_name":"Nastaran","full_name":"Nemati, Nastaran","last_name":"Nemati"},{"first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh","orcid":"https://orcid.org/0000-0001-7246-0610","id":"78614","last_name":"Sadeghi-Kohan"},{"last_name":"Navabi","first_name":"Zainalabedin","full_name":"Navabi, Zainalabedin"}],"doi":"10.1109/ewdts.2010.5742156","user_id":"78614","publication_status":"published"}