{"doi":"10.1109/ewdts.2010.5742156","publication_status":"published","extern":"1","language":[{"iso":"eng"}],"author":[{"first_name":"Arezoo","full_name":"Kamran, Arezoo","last_name":"Kamran"},{"last_name":"Nemati","full_name":"Nemati, Nastaran","first_name":"Nastaran"},{"first_name":"Somayeh","id":"78614","full_name":"Sadeghi-Kohan, Somayeh","orcid":"https://orcid.org/0000-0001-7246-0610","last_name":"Sadeghi-Kohan"},{"last_name":"Navabi","full_name":"Navabi, Zainalabedin","first_name":"Zainalabedin"}],"status":"public","department":[{"_id":"48"}],"type":"conference","date_created":"2023-08-02T11:21:02Z","date_updated":"2023-08-02T11:33:46Z","year":"2011","_id":"46272","title":"Virtual tester development using HDL/PLI","citation":{"ama":"Kamran A, Nemati N, Sadeghi-Kohan S, Navabi Z. Virtual tester development using HDL/PLI. In: 2010 East-West Design & Test Symposium (EWDTS). IEEE; 2011. doi:10.1109/ewdts.2010.5742156","chicago":"Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In 2010 East-West Design & Test Symposium (EWDTS). IEEE, 2011. https://doi.org/10.1109/ewdts.2010.5742156.","apa":"Kamran, A., Nemati, N., Sadeghi-Kohan, S., & Navabi, Z. (2011). Virtual tester development using HDL/PLI. 2010 East-West Design & Test Symposium (EWDTS). https://doi.org/10.1109/ewdts.2010.5742156","short":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, Z. Navabi, in: 2010 East-West Design & Test Symposium (EWDTS), IEEE, 2011.","bibtex":"@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={10.1109/ewdts.2010.5742156}, booktitle={2010 East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }","ieee":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, and Z. Navabi, “Virtual tester development using HDL/PLI,” 2011, doi: 10.1109/ewdts.2010.5742156.","mla":"Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.” 2010 East-West Design & Test Symposium (EWDTS), IEEE, 2011, doi:10.1109/ewdts.2010.5742156."},"publisher":"IEEE","publication":"2010 East-West Design & Test Symposium (EWDTS)","user_id":"78614"}