{"publication":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN)","title":"A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data","citation":{"bibtex":"@inproceedings{Lenz_Henke_Trächtler_2023, title={A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data}, DOI={10.1109/indin51400.2023.10218108}, booktitle={2023 IEEE 21st International Conference on Industrial Informatics (INDIN)}, publisher={IEEE}, author={Lenz, Cederic and Henke, Christian and Trächtler, Ansgar}, year={2023} }","ama":"Lenz C, Henke C, Trächtler A. A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data. In: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN). IEEE; 2023. doi:10.1109/indin51400.2023.10218108","short":"C. Lenz, C. Henke, A. Trächtler, in: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), IEEE, 2023.","ieee":"C. Lenz, C. Henke, and A. Trächtler, “A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data,” 2023, doi: 10.1109/indin51400.2023.10218108.","apa":"Lenz, C., Henke, C., & Trächtler, A. (2023). A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN). https://doi.org/10.1109/indin51400.2023.10218108","mla":"Lenz, Cederic, et al. “A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data.” 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), IEEE, 2023, doi:10.1109/indin51400.2023.10218108.","chicago":"Lenz, Cederic, Christian Henke, and Ansgar Trächtler. “A Methodical Approach to Hybrid Modelling for Contextual Anomaly Detection on Time-Series Data.” In 2023 IEEE 21st International Conference on Industrial Informatics (INDIN). IEEE, 2023. https://doi.org/10.1109/indin51400.2023.10218108."},"_id":"48570","date_updated":"2023-10-31T13:50:43Z","doi":"10.1109/indin51400.2023.10218108","type":"conference","user_id":"41470","quality_controlled":"1","publication_status":"published","date_created":"2023-10-31T13:49:23Z","publisher":"IEEE","language":[{"iso":"eng"}],"author":[{"last_name":"Lenz","full_name":"Lenz, Cederic","first_name":"Cederic"},{"first_name":"Christian","last_name":"Henke","full_name":"Henke, Christian"},{"id":"552","full_name":"Trächtler, Ansgar","last_name":"Trächtler","first_name":"Ansgar"}],"department":[{"_id":"153"},{"_id":"241"}],"status":"public","year":"2023"}