@inproceedings{52742,
  author       = {{Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}},
  location     = {{Maceió}},
  pages        = {{6}},
  publisher    = {{IEEE}},
  title        = {{{Vmin Testing under Variations: Defect vs. Fault Coverage}}},
  year         = {{2024}},
}