{"author":[{"first_name":"Hanieh","full_name":"Jafarzadeh, Hanieh","last_name":"Jafarzadeh"},{"first_name":"Florian","full_name":"Klemme, Florian","last_name":"Klemme"},{"first_name":"Hussam","full_name":"Amrouch, Hussam","last_name":"Amrouch"},{"id":"209","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"publication_status":"accepted","user_id":"209","department":[{"_id":"48"}],"type":"conference","publisher":"IEEE","language":[{"iso":"eng"}],"conference":{"start_date":"2024-04-09","end_date":"2024-04-12","location":"Maceió","name":"IEEE Latin American Test Symposium (LATS)"},"quality_controlled":"1","title":"Vmin Testing under Variations: Defect vs. Fault Coverage","year":"2024","status":"public","date_updated":"2024-03-22T17:06:40Z","date_created":"2024-03-22T16:49:22Z","publication":"IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024","page":"6","_id":"52742","citation":{"short":"H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, n.d., p. 6.","ama":"Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Vmin Testing under Variations: Defect vs. Fault Coverage. In: <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>. IEEE; :6.","bibtex":"@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Vmin Testing under Variations: Defect vs. Fault Coverage}, booktitle={IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }","mla":"Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault Coverage.” <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, IEEE, p. 6.","ieee":"H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Vmin Testing under Variations: Defect vs. Fault Coverage,” in <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, Maceió, p. 6.","chicago":"Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault Coverage.” In <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, 6. IEEE, n.d.","apa":"Jafarzadeh, H., Klemme, F., Amrouch, H., Hellebrand, S., &#38; Wunderlich, H.-J. (n.d.). Vmin Testing under Variations: Defect vs. Fault Coverage. <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, 6."}}