conference paper accepted yes Hanieh Jafarzadeh author Florian Klemme author Hussam Amrouch author Sybille Hellebrand author 2090000-0002-3717-3939 Hans-Joachim Wunderlich author 48 department IEEE Latin American Test Symposium (LATS) IEEE2024Maceió eng 6 Jafarzadeh, H., Klemme, F., Amrouch, H., Hellebrand, S., &#38; Wunderlich, H.-J. (n.d.). Vmin Testing under Variations: Defect vs. Fault Coverage. <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, 6. Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault Coverage.” <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, IEEE, p. 6. H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Vmin Testing under Variations: Defect vs. Fault Coverage,” in <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, Maceió, p. 6. Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Vmin Testing under Variations: Defect vs. Fault Coverage. In: <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>. IEEE; :6. H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, n.d., p. 6. Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault Coverage.” In <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, 6. IEEE, n.d. @inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Vmin Testing under Variations: Defect vs. Fault Coverage}, booktitle={IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} } 527422024-03-22T16:49:22Z2024-03-22T17:06:40Z