---
_id: '52742'
author:
- first_name: Hanieh
  full_name: Jafarzadeh, Hanieh
  last_name: Jafarzadeh
- first_name: Florian
  full_name: Klemme, Florian
  last_name: Klemme
- first_name: Hussam
  full_name: Amrouch, Hussam
  last_name: Amrouch
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: 'Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Vmin Testing
    under Variations: Defect vs. Fault Coverage. In: <i>IEEE Latin American Test Symposium
    (LATS), Maceió, Brazil, April 9-12, 2024</i>. IEEE; :6.'
  apa: 'Jafarzadeh, H., Klemme, F., Amrouch, H., Hellebrand, S., &#38; Wunderlich,
    H.-J. (n.d.). Vmin Testing under Variations: Defect vs. Fault Coverage. <i>IEEE
    Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, 6.'
  bibtex: '@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Vmin
    Testing under Variations: Defect vs. Fault Coverage}, booktitle={IEEE Latin American
    Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}, publisher={IEEE}, author={Jafarzadeh,
    Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich,
    Hans-Joachim}, pages={6} }'
  chicago: 'Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand,
    and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault
    Coverage.” In <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April
    9-12, 2024</i>, 6. IEEE, n.d.'
  ieee: 'H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich,
    “Vmin Testing under Variations: Defect vs. Fault Coverage,” in <i>IEEE Latin American
    Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024</i>, Maceió, p. 6.'
  mla: 'Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault
    Coverage.” <i>IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April
    9-12, 2024</i>, IEEE, p. 6.'
  short: 'H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in:
    IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE,
    n.d., p. 6.'
conference:
  end_date: 2024-04-12
  location: Maceió
  name: IEEE Latin American Test Symposium (LATS)
  start_date: 2024-04-09
date_created: 2024-03-22T16:49:22Z
date_updated: 2024-03-22T17:06:40Z
department:
- _id: '48'
language:
- iso: eng
page: '6'
publication: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12,
  2024
publication_status: accepted
publisher: IEEE
quality_controlled: '1'
status: public
title: 'Vmin Testing under Variations: Defect vs. Fault Coverage'
type: conference
user_id: '209'
year: '2024'
...