{"citation":{"short":"S. Hellebrand, S. Sadeghi-Kohan, H.-J. Wunderlich, in: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, n.d., p. 1.","bibtex":"@inproceedings{Hellebrand_Sadeghi-Kohan_Wunderlich, title={Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, pages={1} }","ieee":"S. Hellebrand, S. Sadeghi-Kohan, and H.-J. Wunderlich, “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle,” in <i>International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024</i>, Xi’an, China, p. 1.","ama":"Hellebrand S, Sadeghi-Kohan S, Wunderlich H-J. Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle. In: <i>International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024</i>. ; :1.","mla":"Hellebrand, Sybille, et al. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” <i>International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024</i>, p. 1.","chicago":"Hellebrand, Sybille, Somayeh Sadeghi-Kohan, and Hans-Joachim Wunderlich. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” In <i>International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024</i>, 1, n.d.","apa":"Hellebrand, S., Sadeghi-Kohan, S., &#38; Wunderlich, H.-J. (n.d.). Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle. <i>International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024</i>, 1."},"type":"conference","department":[{"_id":"48"}],"_id":"52743","status":"public","date_created":"2024-03-22T16:57:53Z","publication_status":"accepted","year":"2024","author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"id":"78614","first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh","last_name":"Sadeghi-Kohan","orcid":"https://orcid.org/0000-0001-7246-0610"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"user_id":"209","title":"Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle","publication":"International Symposium of EDA (ISEDA), Xi'an, China, May 10-13, 2024","conference":{"start_date":"2024-05-10","location":"Xi'an, China","name":"International Symposium of EDA (ISEDA)","end_date":"2024-05-13"},"page":"1","language":[{"iso":"eng"}],"date_updated":"2024-03-22T17:06:02Z"}