{"date_updated":"2024-03-22T17:05:29Z","page":"6","quality_controlled":"1","language":[{"iso":"eng"}],"publication":"European Test Symposium, The Hague, Netherlands, May 20-24, 2024","conference":{"location":"The Hague, NL","name":"IEEE European Test Symposium","end_date":"2024-05-24","start_date":"2024-05-20"},"title":"Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations","user_id":"209","author":[{"first_name":"Hanieh","full_name":"Jafarzadeh, Hanieh","last_name":"Jafarzadeh"},{"first_name":"Florian","full_name":"Klemme, Florian","last_name":"Klemme"},{"first_name":"Hussam","full_name":"Amrouch, Hussam","last_name":"Amrouch"},{"id":"209","first_name":"Sybille","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"year":"2024","status":"public","_id":"52744","publication_status":"accepted","date_created":"2024-03-22T17:04:25Z","department":[{"_id":"48"}],"citation":{"ama":"Jafarzadeh H, Klemme F, Amrouch H, Hellebrand S, Wunderlich H-J. Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. In: <i>European Test Symposium, The Hague, Netherlands, May 20-24, 2024</i>. IEEE; :6.","bibtex":"@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations}, booktitle={European Test Symposium, The Hague, Netherlands, May 20-24, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }","ieee":"H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations,” in <i>European Test Symposium, The Hague, Netherlands, May 20-24, 2024</i>, The Hague, NL, p. 6.","short":"H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, n.d., p. 6.","apa":"Jafarzadeh, H., Klemme, F., Amrouch, H., Hellebrand, S., &#38; Wunderlich, H.-J. (n.d.). Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. <i>European Test Symposium, The Hague, Netherlands, May 20-24, 2024</i>, 6.","mla":"Jafarzadeh, Hanieh, et al. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” <i>European Test Symposium, The Hague, Netherlands, May 20-24, 2024</i>, IEEE, p. 6.","chicago":"Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” In <i>European Test Symposium, The Hague, Netherlands, May 20-24, 2024</i>, 6. IEEE, n.d."},"type":"conference","publisher":"IEEE"}