{"language":[{"iso":"eng"}],"doi":"10.1109/cvprw59228.2023.00109","_id":"53355","citation":{"ieee":"P. C. Neto, A. F. Sequeira, J. S. Cardoso, and P. Terhörst, “PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition,” 2023, doi: <a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">10.1109/cvprw59228.2023.00109</a>.","apa":"Neto, P. C., Sequeira, A. F., Cardoso, J. S., &#38; Terhörst, P. (2023). PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition. <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. <a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">https://doi.org/10.1109/cvprw59228.2023.00109</a>","bibtex":"@inproceedings{Neto_Sequeira_Cardoso_Terhörst_2023, title={PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition}, DOI={<a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">10.1109/cvprw59228.2023.00109</a>}, booktitle={2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)}, publisher={IEEE}, author={Neto, Pedro C. and Sequeira, Ana F. and Cardoso, Jaime S. and Terhörst, Philipp}, year={2023} }","mla":"Neto, Pedro C., et al. “PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition.” <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">10.1109/cvprw59228.2023.00109</a>.","short":"P.C. Neto, A.F. Sequeira, J.S. Cardoso, P. Terhörst, in: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), IEEE, 2023.","chicago":"Neto, Pedro C., Ana F. Sequeira, Jaime S. Cardoso, and Philipp Terhörst. “PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition.” In <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">https://doi.org/10.1109/cvprw59228.2023.00109</a>.","ama":"Neto PC, Sequeira AF, Cardoso JS, Terhörst P. PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition. In: <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">10.1109/cvprw59228.2023.00109</a>"},"year":"2023","author":[{"first_name":"Pedro C.","full_name":"Neto, Pedro C.","last_name":"Neto"},{"last_name":"Sequeira","full_name":"Sequeira, Ana F.","first_name":"Ana F."},{"full_name":"Cardoso, Jaime S.","last_name":"Cardoso","first_name":"Jaime S."},{"id":"97123","first_name":"Philipp","full_name":"Terhörst, Philipp","last_name":"Terhörst"}],"title":"PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition","date_updated":"2024-08-21T07:07:56Z","publication":"2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)","status":"public","date_created":"2024-04-08T09:32:36Z","user_id":"97123","type":"conference","publication_status":"published","publisher":"IEEE"}