{"citation":{"short":"C. Biagi, L. Rethfeld, A. Kuijper, P. Terhörst, in: 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2023.","ama":"Biagi C, Rethfeld L, Kuijper A, Terhörst P. Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. In: <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>","chicago":"Biagi, Clara, Louis Rethfeld, Arjan Kuijper, and Philipp Terhörst. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” In <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>.","ieee":"C. Biagi, L. Rethfeld, A. Kuijper, and P. Terhörst, “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment,” 2023, doi: <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>.","mla":"Biagi, Clara, et al. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>.","apa":"Biagi, C., Rethfeld, L., Kuijper, A., &#38; Terhörst, P. (2023). Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>","bibtex":"@inproceedings{Biagi_Rethfeld_Kuijper_Terhörst_2023, title={Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment}, DOI={<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>}, booktitle={2023 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Biagi, Clara and Rethfeld, Louis and Kuijper, Arjan and Terhörst, Philipp}, year={2023} }"},"author":[{"first_name":"Clara","last_name":"Biagi","full_name":"Biagi, Clara"},{"full_name":"Rethfeld, Louis","last_name":"Rethfeld","first_name":"Louis"},{"full_name":"Kuijper, Arjan","last_name":"Kuijper","first_name":"Arjan"},{"id":"97123","full_name":"Terhörst, Philipp","last_name":"Terhörst","first_name":"Philipp"}],"year":"2023","doi":"10.1109/ijcb57857.2023.10448905","language":[{"iso":"eng"}],"_id":"53357","publication_status":"published","type":"conference","publisher":"IEEE","title":"Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment","publication":"2023 IEEE International Joint Conference on Biometrics (IJCB)","date_updated":"2024-08-21T07:07:31Z","date_created":"2024-04-08T09:34:22Z","status":"public","user_id":"97123"}