{"date_created":"2024-04-09T07:14:43Z","citation":{"ieee":"M. Fourné, D. Wermke, S. Fahl, and Y. Acar, “A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda,” IEEE Security & Privacy, vol. 21, no. 6, pp. 59–63, 2023.","chicago":"Fourné, Marcel, Dominik Wermke, Sascha Fahl, and Yasemin Acar. “A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda.” IEEE Security & Privacy 21, no. 6 (2023): 59–63.","bibtex":"@article{Fourné_Wermke_Fahl_Acar_2023, title={A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda}, volume={21}, number={6}, journal={IEEE Security & Privacy}, publisher={IEEE}, author={Fourné, Marcel and Wermke, Dominik and Fahl, Sascha and Acar, Yasemin}, year={2023}, pages={59–63} }","short":"M. Fourné, D. Wermke, S. Fahl, Y. Acar, IEEE Security & Privacy 21 (2023) 59–63.","ama":"Fourné M, Wermke D, Fahl S, Acar Y. A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda. IEEE Security & Privacy. 2023;21(6):59–63.","apa":"Fourné, M., Wermke, D., Fahl, S., & Acar, Y. (2023). A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda. IEEE Security & Privacy, 21(6), 59–63.","mla":"Fourné, Marcel, et al. “A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda.” IEEE Security & Privacy, vol. 21, no. 6, IEEE, 2023, pp. 59–63."},"status":"public","publication":"IEEE Security & Privacy","type":"journal_article","user_id":"14931","volume":21,"author":[{"last_name":"Fourné","first_name":"Marcel","id":"99291","full_name":"Fourné, Marcel"},{"full_name":"Wermke, Dominik","first_name":"Dominik","last_name":"Wermke"},{"full_name":"Fahl, Sascha","last_name":"Fahl","first_name":"Sascha"},{"last_name":"Acar","first_name":"Yasemin","id":"94636","full_name":"Acar, Yasemin"}],"intvolume":" 21","_id":"53368","department":[{"_id":"858"}],"date_updated":"2024-06-05T13:53:18Z","year":"2023","title":"A Viewpoint on Human Factors in Software Supply Chain Security: A Research Agenda","language":[{"iso":"eng"}],"issue":"6","publisher":"IEEE","page":"59–63"}