{"user_id":"51811","volume":52,"author":[{"last_name":"Shiraz","full_name":"Shiraz, Rashed Khanjani","first_name":"Rashed Khanjani"},{"last_name":"Tavana","id":"31858","first_name":"Madjid","full_name":"Tavana, Madjid"},{"last_name":"Di Caprio","full_name":"Di Caprio, Debora","first_name":"Debora"}],"citation":{"bibtex":"@article{Shiraz_Tavana_Di Caprio_2018, title={Chance-constrained data envelopment analysis modeling with random-rough data}, volume={52}, DOI={<a href=\"https://doi.org/10.1051/ro/2016076\">10.1051/ro/2016076</a>}, number={1}, journal={RAIRO - Operations Research}, publisher={EDP Sciences}, author={Shiraz, Rashed Khanjani and Tavana, Madjid and Di Caprio, Debora}, year={2018}, pages={259–284} }","ieee":"R. K. Shiraz, M. Tavana, and D. Di Caprio, “Chance-constrained data envelopment analysis modeling with random-rough data,” <i>RAIRO - Operations Research</i>, vol. 52, no. 1, pp. 259–284, 2018, doi: <a href=\"https://doi.org/10.1051/ro/2016076\">10.1051/ro/2016076</a>.","mla":"Shiraz, Rashed Khanjani, et al. “Chance-Constrained Data Envelopment Analysis Modeling with Random-Rough Data.” <i>RAIRO - Operations Research</i>, vol. 52, no. 1, EDP Sciences, 2018, pp. 259–84, doi:<a href=\"https://doi.org/10.1051/ro/2016076\">10.1051/ro/2016076</a>.","chicago":"Shiraz, Rashed Khanjani, Madjid Tavana, and Debora Di Caprio. “Chance-Constrained Data Envelopment Analysis Modeling with Random-Rough Data.” <i>RAIRO - Operations Research</i> 52, no. 1 (2018): 259–84. <a href=\"https://doi.org/10.1051/ro/2016076\">https://doi.org/10.1051/ro/2016076</a>.","ama":"Shiraz RK, Tavana M, Di Caprio D. Chance-constrained data envelopment analysis modeling with random-rough data. <i>RAIRO - Operations Research</i>. 2018;52(1):259-284. doi:<a href=\"https://doi.org/10.1051/ro/2016076\">10.1051/ro/2016076</a>","apa":"Shiraz, R. K., Tavana, M., &#38; Di Caprio, D. (2018). Chance-constrained data envelopment analysis modeling with random-rough data. <i>RAIRO - Operations Research</i>, <i>52</i>(1), 259–284. <a href=\"https://doi.org/10.1051/ro/2016076\">https://doi.org/10.1051/ro/2016076</a>","short":"R.K. Shiraz, M. Tavana, D. Di Caprio, RAIRO - Operations Research 52 (2018) 259–284."},"title":"Chance-constrained data envelopment analysis modeling with random-rough data","intvolume":"        52","language":[{"iso":"eng"}],"publication_identifier":{"issn":["0399-0559","1290-3868"]},"department":[{"_id":"277"}],"doi":"10.1051/ro/2016076","_id":"54010","status":"public","year":"2018","publisher":"EDP Sciences","date_updated":"2024-05-06T16:58:31Z","publication_status":"published","type":"journal_article","publication":"RAIRO - Operations Research","date_created":"2024-05-06T16:56:36Z","issue":"1","page":"259-284"}