@article{54668,
  abstract     = {{Samples of dielectric optical waveguides of rib or strip type in thin-film lithium niobate (TFLN) technology are characterized with respect to their optical loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness, we employ a simple perturbational procedure, based on rigorously computed mode profiles of idealized channels, to estimate the attenuation for waveguides with different cross sections. A single fit parameter suffices for an adequate modelling of the effect of the waveguide geometry on the loss levels.}},
  author       = {{Hammer, Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J. Christoph and Silberhorn, Christine and Förstner, Jens}},
  issn         = {{1094-4087}},
  journal      = {{Optics Express}},
  keywords     = {{tet_topic_waveguide}},
  number       = {{13}},
  pages        = {{22878}},
  publisher    = {{Optica Publishing Group}},
  title        = {{{Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides}}},
  doi          = {{10.1364/oe.521766}},
  volume       = {{32}},
  year         = {{2024}},
}