{"author":[{"first_name":"Manfred","orcid":"0000-0002-6331-9348","last_name":"Hammer","id":"48077","full_name":"Hammer, Manfred"},{"first_name":"Silia","orcid":"https://orcid.org/0000-0002-1568-2580","last_name":"Babel","full_name":"Babel, Silia","id":"63231"},{"last_name":"Farheen","orcid":"0000-0001-7730-3489","id":"53444","full_name":"Farheen, Henna","first_name":"Henna"},{"first_name":"Laura","full_name":"Padberg, Laura","id":"40300","last_name":"Padberg"},{"first_name":"J. Christoph","full_name":"Scheytt, J. Christoph","id":"37144","last_name":"Scheytt","orcid":"0000-0002-5950-6618 "},{"id":"26263","full_name":"Silberhorn, Christine","last_name":"Silberhorn","first_name":"Christine"},{"first_name":"Jens","orcid":"0000-0001-7059-9862","last_name":"Förstner","id":"158","full_name":"Förstner, Jens"}],"volume":32,"oa":"1","date_updated":"2024-07-22T07:43:02Z","doi":"10.1364/oe.521766","publication_status":"published","publication_identifier":{"issn":["1094-4087"]},"has_accepted_license":"1","citation":{"apa":"Hammer, M., Babel, S., Farheen, H., Padberg, L., Scheytt, J. C., Silberhorn, C., &#38; Förstner, J. (2024). Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>, <i>32</i>(13), 22878. <a href=\"https://doi.org/10.1364/oe.521766\">https://doi.org/10.1364/oe.521766</a>","bibtex":"@article{Hammer_Babel_Farheen_Padberg_Scheytt_Silberhorn_Förstner_2024, title={Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides}, volume={32}, DOI={<a href=\"https://doi.org/10.1364/oe.521766\">10.1364/oe.521766</a>}, number={13}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Hammer, Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J. Christoph and Silberhorn, Christine and Förstner, Jens}, year={2024}, pages={22878} }","mla":"Hammer, Manfred, et al. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” <i>Optics Express</i>, vol. 32, no. 13, Optica Publishing Group, 2024, p. 22878, doi:<a href=\"https://doi.org/10.1364/oe.521766\">10.1364/oe.521766</a>.","short":"M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn, J. Förstner, Optics Express 32 (2024) 22878.","ama":"Hammer M, Babel S, Farheen H, et al. Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>. 2024;32(13):22878. doi:<a href=\"https://doi.org/10.1364/oe.521766\">10.1364/oe.521766</a>","ieee":"M. Hammer <i>et al.</i>, “Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides,” <i>Optics Express</i>, vol. 32, no. 13, p. 22878, 2024, doi: <a href=\"https://doi.org/10.1364/oe.521766\">10.1364/oe.521766</a>.","chicago":"Hammer, Manfred, Silia Babel, Henna Farheen, Laura Padberg, J. Christoph Scheytt, Christine Silberhorn, and Jens Förstner. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” <i>Optics Express</i> 32, no. 13 (2024): 22878. <a href=\"https://doi.org/10.1364/oe.521766\">https://doi.org/10.1364/oe.521766</a>."},"intvolume":"        32","page":"22878","user_id":"158","department":[{"_id":"61"},{"_id":"429"},{"_id":"623"},{"_id":"263"},{"_id":"288"}],"project":[{"_id":"53","name":"TRR 142: TRR 142 - Maßgeschneiderte nichtlineare Photonik: Von grundlegenden Konzepten zu funktionellen Strukturen","grant_number":"231447078"},{"name":"TRR 142 - C11: TRR 142 - Kompakte Photonenpaar-Quelle mit ultraschnellen Modulatoren auf Basis von CMOS und LNOI (C11*)","_id":"175","grant_number":"231447078"},{"_id":"167","name":"TRR 142 - B06: TRR 142 - Ultraschnelle kohärente opto-elektronische Kontrolle eines photonischen Quantensystems (B06*)","grant_number":"231447078"},{"grant_number":"PROFILNRW-2020-067","name":"PhoQC: PhoQC: Photonisches Quantencomputing","_id":"266"}],"_id":"54668","file_date_updated":"2024-06-10T11:25:00Z","type":"journal_article","status":"public","date_created":"2024-06-10T11:18:06Z","publisher":"Optica Publishing Group","title":"Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides","issue":"13","year":"2024","language":[{"iso":"eng"}],"ddc":["530"],"keyword":["tet_topic_waveguide"],"publication":"Optics Express","file":[{"date_updated":"2024-06-10T11:25:00Z","creator":"fossie","date_created":"2024-06-10T11:25:00Z","file_size":4004782,"file_id":"54669","access_level":"open_access","file_name":"2024-06 Hammer - Optics Express - Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides.pdf","content_type":"application/pdf","relation":"main_file"}],"abstract":[{"lang":"eng","text":"Samples of dielectric optical waveguides of rib or strip type in thin-film lithium niobate (TFLN) technology are characterized with respect to their optical loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness, we employ a simple perturbational procedure, based on rigorously computed mode profiles of idealized channels, to estimate the attenuation for waveguides with different cross sections. A single fit parameter suffices for an adequate modelling of the effect of the waveguide geometry on the loss levels."}]}