article published Manfred Hammer author 480770000-0002-6331-9348 Silia Babel author 63231https://orcid.org/0000-0002-1568-2580 Henna Farheen author 534440000-0001-7730-3489 Laura Padberg author 40300 J. Christoph Scheytt author 371440000-0002-5950-6618 Christine Silberhorn author 26263 Jens Förstner author 1580000-0001-7059-9862 61 department 429 department 623 department 263 department 288 department TRR 142: TRR 142 - Maßgeschneiderte nichtlineare Photonik: Von grundlegenden Konzepten zu funktionellen Strukturen project TRR 142 - C11: TRR 142 - Kompakte Photonenpaar-Quelle mit ultraschnellen Modulatoren auf Basis von CMOS und LNOI (C11*) project TRR 142 - B06: TRR 142 - Ultraschnelle kohärente opto-elektronische Kontrolle eines photonischen Quantensystems (B06*) project PhoQC: PhoQC: Photonisches Quantencomputing project Samples of dielectric optical waveguides of rib or strip type in thin-film lithium niobate (TFLN) technology are characterized with respect to their optical loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness, we employ a simple perturbational procedure, based on rigorously computed mode profiles of idealized channels, to estimate the attenuation for waveguides with different cross sections. A single fit parameter suffices for an adequate modelling of the effect of the waveguide geometry on the loss levels. https://ris.uni-paderborn.de/download/54668/54669/2024-06 Hammer - Optics Express - Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides.pdf application/pdfno Optica Publishing Group2024 eng tet_topic_waveguide 1094-408710.1364/oe.521766 321322878 Hammer, M., Babel, S., Farheen, H., Padberg, L., Scheytt, J. C., Silberhorn, C., &#38; Förstner, J. (2024). Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>, <i>32</i>(13), 22878. <a href="https://doi.org/10.1364/oe.521766">https://doi.org/10.1364/oe.521766</a> Hammer, Manfred, et al. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” <i>Optics Express</i>, vol. 32, no. 13, Optica Publishing Group, 2024, p. 22878, doi:<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>. M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn, J. Förstner, Optics Express 32 (2024) 22878. @article{Hammer_Babel_Farheen_Padberg_Scheytt_Silberhorn_Förstner_2024, title={Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides}, volume={32}, DOI={<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>}, number={13}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Hammer, Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J. Christoph and Silberhorn, Christine and Förstner, Jens}, year={2024}, pages={22878} } Hammer M, Babel S, Farheen H, et al. Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>. 2024;32(13):22878. doi:<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a> M. Hammer <i>et al.</i>, “Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides,” <i>Optics Express</i>, vol. 32, no. 13, p. 22878, 2024, doi: <a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>. Hammer, Manfred, Silia Babel, Henna Farheen, Laura Padberg, J. Christoph Scheytt, Christine Silberhorn, and Jens Förstner. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” <i>Optics Express</i> 32, no. 13 (2024): 22878. <a href="https://doi.org/10.1364/oe.521766">https://doi.org/10.1364/oe.521766</a>. 546682024-06-10T11:18:06Z2024-07-22T07:43:02Z