---
_id: '54668'
abstract:
- lang: eng
  text: Samples of dielectric optical waveguides of rib or strip type in thin-film
    lithium niobate (TFLN) technology are characterized with respect to their optical
    loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness,
    we employ a simple perturbational procedure, based on rigorously computed mode
    profiles of idealized channels, to estimate the attenuation for waveguides with
    different cross sections. A single fit parameter suffices for an adequate modelling
    of the effect of the waveguide geometry on the loss levels.
author:
- first_name: Manfred
  full_name: Hammer, Manfred
  id: '48077'
  last_name: Hammer
  orcid: 0000-0002-6331-9348
- first_name: Silia
  full_name: Babel, Silia
  id: '63231'
  last_name: Babel
  orcid: https://orcid.org/0000-0002-1568-2580
- first_name: Henna
  full_name: Farheen, Henna
  id: '53444'
  last_name: Farheen
  orcid: 0000-0001-7730-3489
- first_name: Laura
  full_name: Padberg, Laura
  id: '40300'
  last_name: Padberg
- first_name: J. Christoph
  full_name: Scheytt, J. Christoph
  id: '37144'
  last_name: Scheytt
  orcid: '0000-0002-5950-6618 '
- first_name: Christine
  full_name: Silberhorn, Christine
  id: '26263'
  last_name: Silberhorn
- first_name: Jens
  full_name: Förstner, Jens
  id: '158'
  last_name: Förstner
  orcid: 0000-0001-7059-9862
citation:
  ama: Hammer M, Babel S, Farheen H, et al. Estimation of losses caused by sidewall
    roughness in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>.
    2024;32(13):22878. doi:<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>
  apa: Hammer, M., Babel, S., Farheen, H., Padberg, L., Scheytt, J. C., Silberhorn,
    C., &#38; Förstner, J. (2024). Estimation of losses caused by sidewall roughness
    in thin-film lithium niobate rib and strip waveguides. <i>Optics Express</i>,
    <i>32</i>(13), 22878. <a href="https://doi.org/10.1364/oe.521766">https://doi.org/10.1364/oe.521766</a>
  bibtex: '@article{Hammer_Babel_Farheen_Padberg_Scheytt_Silberhorn_Förstner_2024,
    title={Estimation of losses caused by sidewall roughness in thin-film lithium
    niobate rib and strip waveguides}, volume={32}, DOI={<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>},
    number={13}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Hammer,
    Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J.
    Christoph and Silberhorn, Christine and Förstner, Jens}, year={2024}, pages={22878}
    }'
  chicago: 'Hammer, Manfred, Silia Babel, Henna Farheen, Laura Padberg, J. Christoph
    Scheytt, Christine Silberhorn, and Jens Förstner. “Estimation of Losses Caused
    by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.”
    <i>Optics Express</i> 32, no. 13 (2024): 22878. <a href="https://doi.org/10.1364/oe.521766">https://doi.org/10.1364/oe.521766</a>.'
  ieee: 'M. Hammer <i>et al.</i>, “Estimation of losses caused by sidewall roughness
    in thin-film lithium niobate rib and strip waveguides,” <i>Optics Express</i>,
    vol. 32, no. 13, p. 22878, 2024, doi: <a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>.'
  mla: Hammer, Manfred, et al. “Estimation of Losses Caused by Sidewall Roughness
    in Thin-Film Lithium Niobate Rib and Strip Waveguides.” <i>Optics Express</i>,
    vol. 32, no. 13, Optica Publishing Group, 2024, p. 22878, doi:<a href="https://doi.org/10.1364/oe.521766">10.1364/oe.521766</a>.
  short: M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn,
    J. Förstner, Optics Express 32 (2024) 22878.
date_created: 2024-06-10T11:18:06Z
date_updated: 2024-07-22T07:43:02Z
ddc:
- '530'
department:
- _id: '61'
- _id: '429'
- _id: '623'
- _id: '263'
- _id: '288'
doi: 10.1364/oe.521766
file:
- access_level: open_access
  content_type: application/pdf
  creator: fossie
  date_created: 2024-06-10T11:25:00Z
  date_updated: 2024-06-10T11:25:00Z
  file_id: '54669'
  file_name: 2024-06 Hammer - Optics Express - Estimation of losses caused by sidewall
    roughness in thin-film lithium niobate rib and strip waveguides.pdf
  file_size: 4004782
  relation: main_file
file_date_updated: 2024-06-10T11:25:00Z
has_accepted_license: '1'
intvolume: '        32'
issue: '13'
keyword:
- tet_topic_waveguide
language:
- iso: eng
oa: '1'
page: '22878'
project:
- _id: '53'
  grant_number: '231447078'
  name: 'TRR 142: TRR 142 - Maßgeschneiderte nichtlineare Photonik: Von grundlegenden
    Konzepten zu funktionellen Strukturen'
- _id: '175'
  grant_number: '231447078'
  name: 'TRR 142 - C11: TRR 142 - Kompakte Photonenpaar-Quelle mit ultraschnellen
    Modulatoren auf Basis von CMOS und LNOI (C11*)'
- _id: '167'
  grant_number: '231447078'
  name: 'TRR 142 - B06: TRR 142 - Ultraschnelle kohärente opto-elektronische Kontrolle
    eines photonischen Quantensystems (B06*)'
- _id: '266'
  grant_number: PROFILNRW-2020-067
  name: 'PhoQC: PhoQC: Photonisches Quantencomputing'
publication: Optics Express
publication_identifier:
  issn:
  - 1094-4087
publication_status: published
publisher: Optica Publishing Group
status: public
title: Estimation of losses caused by sidewall roughness in thin-film lithium niobate
  rib and strip waveguides
type: journal_article
user_id: '158'
volume: 32
year: '2024'
...