---
_id: '54966'
abstract:
- lang: eng
  text: Piezoresponse force microscopy (PFM) is one of the most widespread methods
    for investigating and visualizing ferroelectric domain structures down to the
    nanometer length scale. PFM makes use of the direct coupling of the piezoelectric
    response to the crystal lattice, and hence, it is most often applied to spatially
    map the three-dimensional (3D) near-surface domain distribution of any polar or
    ferroic sample. Nonetheless, since most samples investigated by PFM are at least
    semiconducting or fully insulating, the electric ac field emerging from the conductive
    scanning force microscopy (SFM) tip penetrates the sample and, hence, may also
    couple to polar features that are deeply buried into the bulk of the sample under
    investigation. Thus, in the work presented here, we experimentally and theoretically
    explore the contrast and depth resolution capabilities of PFM, by analyzing the
    dependence of several key parameters. These key parameters include the depth of
    the buried feature, i.e., here a domain wall (DW), as well as PFM-relevant technical
    parameters such as the tip radius, the PFM drive voltage and frequency, and the
    signal-to-noise ratio. The theoretical predictions are experimentally verified
    using x-cut periodically poled lithium niobate single crystals that are specially
    prepared into wedge-shaped samples, in order to allow the buried feature, here
    the DW, to be “positioned” at any depth into the bulk. This inspection essentially
    contributes to the fundamental understanding in PFM contrast analysis and to the
    reconstruction of 3D domain structures down to a 1 μm-penetration depth into the
    sample.
article_type: original
author:
- first_name: Matthias
  full_name: Roeper, Matthias
  last_name: Roeper
- first_name: Samuel D.
  full_name: Seddon, Samuel D.
  last_name: Seddon
- first_name: Zeeshan H.
  full_name: Amber, Zeeshan H.
  last_name: Amber
- first_name: Michael
  full_name: Rüsing, Michael
  id: '22501'
  last_name: Rüsing
  orcid: 0000-0003-4682-4577
- first_name: Lukas M.
  full_name: Eng, Lukas M.
  last_name: Eng
citation:
  ama: Roeper M, Seddon SD, Amber ZH, Rüsing M, Eng LM. Depth resolution in piezoresponse
    force microscopy. <i>Journal of Applied Physics</i>. 2024;135(22). doi:<a href="https://doi.org/10.1063/5.0206784">10.1063/5.0206784</a>
  apa: Roeper, M., Seddon, S. D., Amber, Z. H., Rüsing, M., &#38; Eng, L. M. (2024).
    Depth resolution in piezoresponse force microscopy. <i>Journal of Applied Physics</i>,
    <i>135</i>(22). <a href="https://doi.org/10.1063/5.0206784">https://doi.org/10.1063/5.0206784</a>
  bibtex: '@article{Roeper_Seddon_Amber_Rüsing_Eng_2024, title={Depth resolution in
    piezoresponse force microscopy}, volume={135}, DOI={<a href="https://doi.org/10.1063/5.0206784">10.1063/5.0206784</a>},
    number={22}, journal={Journal of Applied Physics}, publisher={AIP Publishing},
    author={Roeper, Matthias and Seddon, Samuel D. and Amber, Zeeshan H. and Rüsing,
    Michael and Eng, Lukas M.}, year={2024} }'
  chicago: Roeper, Matthias, Samuel D. Seddon, Zeeshan H. Amber, Michael Rüsing, and
    Lukas M. Eng. “Depth Resolution in Piezoresponse Force Microscopy.” <i>Journal
    of Applied Physics</i> 135, no. 22 (2024). <a href="https://doi.org/10.1063/5.0206784">https://doi.org/10.1063/5.0206784</a>.
  ieee: 'M. Roeper, S. D. Seddon, Z. H. Amber, M. Rüsing, and L. M. Eng, “Depth resolution
    in piezoresponse force microscopy,” <i>Journal of Applied Physics</i>, vol. 135,
    no. 22, 2024, doi: <a href="https://doi.org/10.1063/5.0206784">10.1063/5.0206784</a>.'
  mla: Roeper, Matthias, et al. “Depth Resolution in Piezoresponse Force Microscopy.”
    <i>Journal of Applied Physics</i>, vol. 135, no. 22, AIP Publishing, 2024, doi:<a
    href="https://doi.org/10.1063/5.0206784">10.1063/5.0206784</a>.
  short: M. Roeper, S.D. Seddon, Z.H. Amber, M. Rüsing, L.M. Eng, Journal of Applied
    Physics 135 (2024).
date_created: 2024-07-01T21:00:43Z
date_updated: 2025-04-03T12:35:34Z
department:
- _id: '15'
- _id: '169'
- _id: '288'
- _id: '623'
doi: 10.1063/5.0206784
intvolume: '       135'
issue: '22'
keyword:
- Ferroelectrics
- lithium niobate
- piezoresponse force microscopy
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://doi.org/10.1063/5.0206784
oa: '1'
publication: Journal of Applied Physics
publication_identifier:
  issn:
  - 0021-8979
  - 1089-7550
publication_status: published
publisher: AIP Publishing
quality_controlled: '1'
status: public
title: Depth resolution in piezoresponse force microscopy
type: journal_article
user_id: '22501'
volume: 135
year: '2024'
...