{"language":[{"iso":"eng"}],"_id":"55663","user_id":"97123","status":"public","publication":"2023 IEEE International Joint Conference on Biometrics (IJCB)","type":"conference","title":"Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment","doi":"10.1109/ijcb57857.2023.10448905","date_updated":"2026-02-19T07:50:05Z","publisher":"IEEE","date_created":"2024-08-21T07:04:10Z","author":[{"first_name":"Clara","last_name":"Biagi","full_name":"Biagi, Clara"},{"first_name":"Louis","last_name":"Rethfeld","full_name":"Rethfeld, Louis"},{"first_name":"Arjan","full_name":"Kuijper, Arjan","last_name":"Kuijper"},{"first_name":"Philipp","full_name":"Terhörst, Philipp","last_name":"Terhörst"}],"year":"2024","citation":{"apa":"Biagi, C., Rethfeld, L., Kuijper, A., & Terhörst, P. (2024). Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. 2023 IEEE International Joint Conference on Biometrics (IJCB). https://doi.org/10.1109/ijcb57857.2023.10448905","short":"C. Biagi, L. Rethfeld, A. Kuijper, P. Terhörst, in: 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2024.","mla":"Biagi, Clara, et al. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2024, doi:10.1109/ijcb57857.2023.10448905.","bibtex":"@inproceedings{Biagi_Rethfeld_Kuijper_Terhörst_2024, title={Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment}, DOI={10.1109/ijcb57857.2023.10448905}, booktitle={2023 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Biagi, Clara and Rethfeld, Louis and Kuijper, Arjan and Terhörst, Philipp}, year={2024} }","chicago":"Biagi, Clara, Louis Rethfeld, Arjan Kuijper, and Philipp Terhörst. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” In 2023 IEEE International Joint Conference on Biometrics (IJCB). IEEE, 2024. https://doi.org/10.1109/ijcb57857.2023.10448905.","ieee":"C. Biagi, L. Rethfeld, A. Kuijper, and P. Terhörst, “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment,” 2024, doi: 10.1109/ijcb57857.2023.10448905.","ama":"Biagi C, Rethfeld L, Kuijper A, Terhörst P. Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. In: 2023 IEEE International Joint Conference on Biometrics (IJCB). IEEE; 2024. doi:10.1109/ijcb57857.2023.10448905"},"publication_status":"published"}