{"type":"conference","_id":"56014","year":"2024","status":"public","date_updated":"2024-09-04T09:29:01Z","place":"San Diego, CA","language":[{"iso":"eng"}],"author":[{"full_name":"Jafarzadeh, Hanieh","last_name":"Jafarzadeh","first_name":"Hanieh"},{"first_name":"Florian","last_name":"Klemme","full_name":"Klemme, Florian"},{"id":"36703","first_name":"Jan Dennis","last_name":"Reimer","full_name":"Reimer, Jan Dennis"},{"first_name":"Hussam","last_name":" Amrouch","full_name":" Amrouch, Hussam"},{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"user_id":"36703","title":"Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing","citation":{"apa":"Jafarzadeh, H., Klemme, F., Reimer, J. D.,  Amrouch, H., Hellebrand, S., &#38; Wunderlich, H.-J. (2024). Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. <i>To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024</i>. IEEE International Test Conference (ITC’24), San Diego, CA, USA.","ieee":"H. Jafarzadeh, F. Klemme, J. D. Reimer, H.  Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing,” presented at the IEEE International Test Conference (ITC’24), San Diego, CA, USA, 2024.","short":"H. Jafarzadeh, F. Klemme, J.D. Reimer, H.  Amrouch, S. Hellebrand, H.-J. Wunderlich, in: To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024, IEEE, San Diego, CA, 2024.","ama":"Jafarzadeh H, Klemme F, Reimer JD,  Amrouch H, Hellebrand S, Wunderlich H-J. Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. In: <i>To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024</i>. IEEE; 2024.","chicago":"Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.” In <i>To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024</i>. San Diego, CA: IEEE, 2024.","mla":"Jafarzadeh, Hanieh, et al. “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.” <i>To Appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024</i>, IEEE, 2024.","bibtex":"@inproceedings{Jafarzadeh_Klemme_Reimer_ Amrouch_Hellebrand_Wunderlich_2024, place={San Diego, CA}, title={Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing}, booktitle={To appear in: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and  Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2024} }"},"conference":{"name":"IEEE International Test Conference (ITC'24)","end_date":"2024-11-08","location":"San Diego, CA, USA","start_date":"2024-11-03"},"department":[{"_id":"48"}],"publication":"To appear in: IEEE International Test Conference (ITC'24), San Diego, CA, USA, November 2024","date_created":"2024-09-04T09:25:20Z","publisher":"IEEE"}