{"doi":"10.1109/emceurope59828.2024.10722094","_id":"56781","citation":{"ieee":"J. Maalouly <i>et al.</i>, “Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications,” 2024, doi: <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">10.1109/emceurope59828.2024.10722094</a>.","mla":"Maalouly, Jad, et al. “Evaluation of Simulated and Real Measurement Data for AI-Based Interference Classification in EMC Applications.” <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">10.1109/emceurope59828.2024.10722094</a>.","apa":"Maalouly, J., Hemker, D., Lange, S., Olbrich, M., Hedayat, C., Kutter, J., &#38; Mathis, H. (2024). Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications. <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">https://doi.org/10.1109/emceurope59828.2024.10722094</a>","bibtex":"@inproceedings{Maalouly_Hemker_Lange_Olbrich_Hedayat_Kutter_Mathis_2024, title={Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications}, DOI={<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">10.1109/emceurope59828.2024.10722094</a>}, booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Maalouly, Jad and Hemker, Dennis and Lange, Sven and Olbrich, Marcel and Hedayat, Christian and Kutter, Jürgen and Mathis, Harald}, year={2024} }","ama":"Maalouly J, Hemker D, Lange S, et al. Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications. In: <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">10.1109/emceurope59828.2024.10722094</a>","chicago":"Maalouly, Jad, Dennis Hemker, Sven Lange, Marcel Olbrich, Christian Hedayat, Jürgen Kutter, and Harald Mathis. “Evaluation of Simulated and Real Measurement Data for AI-Based Interference Classification in EMC Applications.” In <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722094\">https://doi.org/10.1109/emceurope59828.2024.10722094</a>.","short":"J. Maalouly, D. Hemker, S. Lange, M. Olbrich, C. Hedayat, J. Kutter, H. Mathis, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024."},"author":[{"first_name":"Jad","full_name":"Maalouly, Jad","last_name":"Maalouly"},{"first_name":"Dennis","full_name":"Hemker, Dennis","last_name":"Hemker"},{"full_name":"Lange, Sven","last_name":"Lange","first_name":"Sven"},{"first_name":"Marcel","last_name":"Olbrich","full_name":"Olbrich, Marcel"},{"full_name":"Hedayat, Christian","last_name":"Hedayat","first_name":"Christian"},{"last_name":"Kutter","full_name":"Kutter, Jürgen","first_name":"Jürgen"},{"last_name":"Mathis","full_name":"Mathis, Harald","first_name":"Harald"}],"year":"2024","department":[{"_id":"59"}],"title":"Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications","publication":"2024 International Symposium on Electromagnetic Compatibility – EMC Europe","date_updated":"2024-10-29T10:35:57Z","date_created":"2024-10-29T10:34:53Z","status":"public","user_id":"38240","publication_status":"published","type":"conference","publisher":"IEEE"}