{"type":"conference","_id":"56924","status":"public","year":"2024","publication_status":"published","language":[{"iso":"eng"}],"place":"Hamburg","date_updated":"2024-11-06T13:42:40Z","author":[{"full_name":"Stiemer, Marcus","first_name":"Marcus","last_name":"Stiemer"},{"last_name":"Lange","id":"38240","first_name":"Sven","full_name":"Lange, Sven","orcid":"0009-0007-9150-2266 "},{"last_name":"Schröder","first_name":"Dominik","full_name":"Schröder, Dominik"},{"last_name":"Hedayat","first_name":"Christian","full_name":"Hedayat, Christian"},{"full_name":"Maalouly, Jad","last_name":"Maalouly","first_name":"Jad"},{"last_name":"Hemker","first_name":"Dennis","full_name":"Hemker, Dennis"},{"last_name":"Mathis","first_name":"Harald","full_name":"Mathis, Harald"}],"user_id":"38240","citation":{"chicago":"Stiemer, Marcus, Sven Lange, Dominik Schröder, Christian Hedayat, Jad Maalouly, Dennis Hemker, and Harald Mathis. “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence.” In <i>2024 Smart Systems Integration Conference and Exhibition (SSI)</i>. Hamburg: IEEE, 2024. <a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">https://doi.org/10.1109/ssi63222.2024.10740546</a>.","mla":"Stiemer, Marcus, et al. “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence.” <i>2024 Smart Systems Integration Conference and Exhibition (SSI)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">10.1109/ssi63222.2024.10740546</a>.","bibtex":"@inproceedings{Stiemer_Lange_Schröder_Hedayat_Maalouly_Hemker_Mathis_2024, place={Hamburg}, title={Enhancing Information Extraction in EMC Measurements through Artificial Intelligence}, DOI={<a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">10.1109/ssi63222.2024.10740546</a>}, booktitle={2024 Smart Systems Integration Conference and Exhibition (SSI)}, publisher={IEEE}, author={Stiemer, Marcus and Lange, Sven and Schröder, Dominik and Hedayat, Christian and Maalouly, Jad and Hemker, Dennis and Mathis, Harald}, year={2024} }","ieee":"M. Stiemer <i>et al.</i>, “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence,” presented at the 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg, 2024, doi: <a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">10.1109/ssi63222.2024.10740546</a>.","apa":"Stiemer, M., Lange, S., Schröder, D., Hedayat, C., Maalouly, J., Hemker, D., &#38; Mathis, H. (2024). Enhancing Information Extraction in EMC Measurements through Artificial Intelligence. <i>2024 Smart Systems Integration Conference and Exhibition (SSI)</i>. 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg. <a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">https://doi.org/10.1109/ssi63222.2024.10740546</a>","short":"M. Stiemer, S. Lange, D. Schröder, C. Hedayat, J. Maalouly, D. Hemker, H. Mathis, in: 2024 Smart Systems Integration Conference and Exhibition (SSI), IEEE, Hamburg, 2024.","ama":"Stiemer M, Lange S, Schröder D, et al. Enhancing Information Extraction in EMC Measurements through Artificial Intelligence. In: <i>2024 Smart Systems Integration Conference and Exhibition (SSI)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/ssi63222.2024.10740546\">10.1109/ssi63222.2024.10740546</a>"},"title":"Enhancing Information Extraction in EMC Measurements through Artificial Intelligence","conference":{"name":"2024 Smart Systems Integration Conference and Exhibition (SSI)","start_date":"2024-04-26","location":"Hamburg","end_date":"2024-04-28"},"publication":"2024 Smart Systems Integration Conference and Exhibition (SSI)","department":[{"_id":"59"}],"date_created":"2024-11-06T13:36:01Z","doi":"10.1109/ssi63222.2024.10740546","publisher":"IEEE"}