@inproceedings{57528,
  abstract     = {{Based on the surface equivalence principle an equivalent near-field source can be determined by measurements with a near-field scanner. One application is to use the source to simulate the interferences of the device-under-test with other objects in its close environment. Due to a limited signal-to-noise ratio in practical applications, noise adds to the near-field source. Hence, noise effects affect the quality of the simulation results and cause uncertainties. The influence of the noise effects is investigated by a simulative approach with artificially added noise. Two test devices with different a geometric dimension, operating frequency and excited power are evaluated for different characteristics and signal-to-noise ratios to assess the impact of the simulation results. Finally, in a combined simulation an equivalent near-field source will disturb an IoT-device and the voltages at two resistors on the device are examined.}},
  author       = {{Schröder, Dominik and Kiefner, Ulrich and Hedayat, Christian and Förstner, Jens}},
  booktitle    = {{2024 International Symposium on Electromagnetic Compatibility – EMC Europe}},
  keywords     = {{tet_topic_hf, tet_enas}},
  publisher    = {{IEEE}},
  title        = {{{Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources}}},
  doi          = {{10.1109/emceurope59828.2024.10722220}},
  year         = {{2024}},
}