Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources Schröder, Dominik Kiefner, Ulrich Hedayat, Christian Förstner, Jens tet_topic_hf tet_enas Based on the surface equivalence principle an equivalent near-field source can be determined by measurements with a near-field scanner. One application is to use the source to simulate the interferences of the device-under-test with other objects in its close environment. Due to a limited signal-to-noise ratio in practical applications, noise adds to the near-field source. Hence, noise effects affect the quality of the simulation results and cause uncertainties. The influence of the noise effects is investigated by a simulative approach with artificially added noise. Two test devices with different a geometric dimension, operating frequency and excited power are evaluated for different characteristics and signal-to-noise ratios to assess the impact of the simulation results. Finally, in a combined simulation an equivalent near-field source will disturb an IoT-device and the voltages at two resistors on the device are examined. IEEE 2024 info:eu-repo/semantics/conferenceObject doc-type:conferenceObject text http://purl.org/coar/resource_type/c_5794 https://ris.uni-paderborn.de/record/57528 Schröder D, Kiefner U, Hedayat C, Förstner J. Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources. In: <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE; 2024. doi:<a href="https://doi.org/10.1109/emceurope59828.2024.10722220">10.1109/emceurope59828.2024.10722220</a> eng info:eu-repo/semantics/altIdentifier/doi/10.1109/emceurope59828.2024.10722220 info:eu-repo/semantics/closedAccess