{"doi":"10.1109/emceurope59828.2024.10722220","_id":"57528","date_updated":"2024-11-30T19:30:59Z","abstract":[{"text":"Based on the surface equivalence principle an equivalent near-field source can be determined by measurements with a near-field scanner. One application is to use the source to simulate the interferences of the device-under-test with other objects in its close environment. Due to a limited signal-to-noise ratio in practical applications, noise adds to the near-field source. Hence, noise effects affect the quality of the simulation results and cause uncertainties. The influence of the noise effects is investigated by a simulative approach with artificially added noise. Two test devices with different a geometric dimension, operating frequency and excited power are evaluated for different characteristics and signal-to-noise ratios to assess the impact of the simulation results. Finally, in a combined simulation an equivalent near-field source will disturb an IoT-device and the voltages at two resistors on the device are examined.","lang":"eng"}],"citation":{"short":"D. Schröder, U. Kiefner, C. Hedayat, J. Förstner, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024.","ieee":"D. Schröder, U. Kiefner, C. Hedayat, and J. Förstner, “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources,” 2024, doi: <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">10.1109/emceurope59828.2024.10722220</a>.","ama":"Schröder D, Kiefner U, Hedayat C, Förstner J. Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources. In: <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">10.1109/emceurope59828.2024.10722220</a>","bibtex":"@inproceedings{Schröder_Kiefner_Hedayat_Förstner_2024, title={Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources}, DOI={<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">10.1109/emceurope59828.2024.10722220</a>}, booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Schröder, Dominik and Kiefner, Ulrich and Hedayat, Christian and Förstner, Jens}, year={2024} }","chicago":"Schröder, Dominik, Ulrich Kiefner, Christian Hedayat, and Jens Förstner. “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources.” In <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">https://doi.org/10.1109/emceurope59828.2024.10722220</a>.","mla":"Schröder, Dominik, et al. “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources.” <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">10.1109/emceurope59828.2024.10722220</a>.","apa":"Schröder, D., Kiefner, U., Hedayat, C., &#38; Förstner, J. (2024). Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources. <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. <a href=\"https://doi.org/10.1109/emceurope59828.2024.10722220\">https://doi.org/10.1109/emceurope59828.2024.10722220</a>"},"title":"Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources","publication":"2024 International Symposium on Electromagnetic Compatibility – EMC Europe","year":"2024","keyword":["tet_topic_hf","tet_enas"],"author":[{"first_name":"Dominik","full_name":"Schröder, Dominik","last_name":"Schröder"},{"first_name":"Ulrich","last_name":"Kiefner","full_name":"Kiefner, Ulrich"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"id":"158","last_name":"Förstner","full_name":"Förstner, Jens","orcid":"0000-0001-7059-9862","first_name":"Jens"}],"status":"public","department":[{"_id":"61"}],"language":[{"iso":"eng"}],"publisher":"IEEE","publication_status":"published","date_created":"2024-11-30T17:54:35Z","type":"conference","user_id":"158"}