conference paper published Dominik Schröder author Ulrich Kiefner author Christian Hedayat author Jens Förstner author 1580000-0001-7059-9862 61 department Based on the surface equivalence principle an equivalent near-field source can be determined by measurements with a near-field scanner. One application is to use the source to simulate the interferences of the device-under-test with other objects in its close environment. Due to a limited signal-to-noise ratio in practical applications, noise adds to the near-field source. Hence, noise effects affect the quality of the simulation results and cause uncertainties. The influence of the noise effects is investigated by a simulative approach with artificially added noise. Two test devices with different a geometric dimension, operating frequency and excited power are evaluated for different characteristics and signal-to-noise ratios to assess the impact of the simulation results. Finally, in a combined simulation an equivalent near-field source will disturb an IoT-device and the voltages at two resistors on the device are examined. IEEE2024 eng tet_topic_hftet_enas 10.1109/emceurope59828.2024.10722220 D. Schröder, U. Kiefner, C. Hedayat, and J. Förstner, “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources,” 2024, doi: <a href="https://doi.org/10.1109/emceurope59828.2024.10722220">10.1109/emceurope59828.2024.10722220</a>. Schröder, D., Kiefner, U., Hedayat, C., &#38; Förstner, J. (2024). Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources. <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. <a href="https://doi.org/10.1109/emceurope59828.2024.10722220">https://doi.org/10.1109/emceurope59828.2024.10722220</a> Schröder, Dominik, Ulrich Kiefner, Christian Hedayat, and Jens Förstner. “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources.” In <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE, 2024. <a href="https://doi.org/10.1109/emceurope59828.2024.10722220">https://doi.org/10.1109/emceurope59828.2024.10722220</a>. D. Schröder, U. Kiefner, C. Hedayat, J. Förstner, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024. Schröder, Dominik, et al. “Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources.” <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, IEEE, 2024, doi:<a href="https://doi.org/10.1109/emceurope59828.2024.10722220">10.1109/emceurope59828.2024.10722220</a>. @inproceedings{Schröder_Kiefner_Hedayat_Förstner_2024, title={Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources}, DOI={<a href="https://doi.org/10.1109/emceurope59828.2024.10722220">10.1109/emceurope59828.2024.10722220</a>}, booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Schröder, Dominik and Kiefner, Ulrich and Hedayat, Christian and Förstner, Jens}, year={2024} } Schröder D, Kiefner U, Hedayat C, Förstner J. Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources. In: <i>2024 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE; 2024. doi:<a href="https://doi.org/10.1109/emceurope59828.2024.10722220">10.1109/emceurope59828.2024.10722220</a> 575282024-11-30T17:54:35Z2024-11-30T19:30:59Z