[{"publisher":"Elsevier BV","article_number":"114101","_id":"58178","user_id":"77496","year":"2025","author":[{"last_name":"Lindner","id":"20797","full_name":"Lindner, Jörg K. N.","first_name":"Jörg K. N."},{"last_name":"Zietlow","full_name":"Zietlow, Christian","first_name":"Christian"}],"publication_status":"published","date_updated":"2025-02-03T08:23:19Z","publication_identifier":{"issn":["0304-3991"]},"type":"journal_article","language":[{"iso":"eng"}],"publication":"Ultramicroscopy","date_created":"2025-01-14T09:41:23Z","citation":{"bibtex":"@article{Lindner_Zietlow_2025, title={An applied noise model for low-loss EELS maps}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Lindner, Jörg K. N. and Zietlow, Christian}, year={2025} }","ieee":"J. K. N. Lindner and C. Zietlow, “An applied noise model for low-loss EELS maps,” <i>Ultramicroscopy</i>, Art. no. 114101, 2025, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","mla":"Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 114101, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","short":"J.K.N. Lindner, C. Zietlow, Ultramicroscopy (2025).","chicago":"Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 2025. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>.","apa":"Lindner, J. K. N., &#38; Zietlow, C. (2025). An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>, Article 114101. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>","ama":"Lindner JKN, Zietlow C. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>. Published online 2025. doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>"},"status":"public","doi":"10.1016/j.ultramic.2024.114101","department":[{"_id":"286"},{"_id":"15"}],"title":"An applied noise model for low-loss EELS maps"}]