{"language":[{"iso":"eng"}],"type":"journal_article","article_number":"114101","date_updated":"2025-01-14T09:42:07Z","author":[{"last_name":"Zietlow","full_name":"Zietlow, Christian","first_name":"Christian"},{"last_name":"Lindner","full_name":"Lindner, Jörg K.N.","first_name":"Jörg K.N."}],"publication_status":"published","department":[{"_id":"286"},{"_id":"15"}],"user_id":"77496","publisher":"Elsevier BV","citation":{"short":"C. Zietlow, J.K.N. Lindner, Ultramicroscopy (2025).","ieee":"C. Zietlow and J. K. N. Lindner, “An applied noise model for low-loss EELS maps,” <i>Ultramicroscopy</i>, Art. no. 114101, 2025, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","ama":"Zietlow C, Lindner JKN. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>. Published online 2025. doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>","mla":"Zietlow, Christian, and Jörg K. N. Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 114101, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","chicago":"Zietlow, Christian, and Jörg K.N. Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 2025. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>.","bibtex":"@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss EELS maps}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow, Christian and Lindner, Jörg K.N.}, year={2025} }","apa":"Zietlow, C., &#38; Lindner, J. K. N. (2025). An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>, Article 114101. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>"},"doi":"10.1016/j.ultramic.2024.114101","status":"public","title":"An applied noise model for low-loss EELS maps","year":"2025","date_created":"2025-01-14T09:41:23Z","publication":"Ultramicroscopy","publication_identifier":{"issn":["0304-3991"]},"_id":"58178"}