article published Jörg K. N. Lindner author 20797 Christian Zietlow author 286 department 15 department Elsevier BV2025 eng 0304-399110.1016/j.ultramic.2024.114101 J. K. N. Lindner and C. Zietlow, “An applied noise model for low-loss EELS maps,” <i>Ultramicroscopy</i>, Art. no. 114101, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>. Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 2025. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>. Lindner JKN, Zietlow C. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>. Published online 2025. doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a> Lindner, J. K. N., &#38; Zietlow, C. (2025). An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>, Article 114101. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a> @article{Lindner_Zietlow_2025, title={An applied noise model for low-loss EELS maps}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Lindner, Jörg K. N. and Zietlow, Christian}, year={2025} } Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 114101, Elsevier BV, 2025, doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>. J.K.N. Lindner, C. Zietlow, Ultramicroscopy (2025). 581782025-01-14T09:41:23Z2025-02-03T08:23:19Z