{"title":"AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode","abstract":[{"lang":"eng","text":"AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode"}],"_id":"58611","volume":15,"type":"journal_article","page":"603–611","user_id":"54556","year":"2024","publication_identifier":{"issn":["2190-4286"]},"citation":{"bibtex":"@article{Müller_Stadler_de los Arcos de Pedro_Keller_Grundmeier_2024, title={AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode}, volume={15}, DOI={<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>}, number={1}, journal={Beilstein Journal of Nanotechnology}, author={Müller, Hendrik and Stadler, Hartmut and de los Arcos de Pedro, Maria Teresa and Keller, Adrian and Grundmeier, Guido}, year={2024}, pages={603–611} }","chicago":"Müller, Hendrik, Hartmut Stadler, Maria Teresa de los Arcos de Pedro, Adrian Keller, and Guido Grundmeier. “AFM-IR Investigation of Thin PECVD SiO x Films on a Polypropylene Substrate in the Surface-Sensitive Mode.” <i>Beilstein Journal of Nanotechnology</i> 15, no. 1 (2024): 603–611. <a href=\"https://doi.org/10.3762/bjnano.15.51\">https://doi.org/10.3762/bjnano.15.51</a>.","ama":"Müller H, Stadler H, de los Arcos de Pedro MT, Keller A, Grundmeier G. AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode. <i>Beilstein Journal of Nanotechnology</i>. 2024;15(1):603–611. doi:<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>","apa":"Müller, H., Stadler, H., de los Arcos de Pedro, M. T., Keller, A., &#38; Grundmeier, G. (2024). AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode. <i>Beilstein Journal of Nanotechnology</i>, <i>15</i>(1), 603–611. <a href=\"https://doi.org/10.3762/bjnano.15.51\">https://doi.org/10.3762/bjnano.15.51</a>","mla":"Müller, Hendrik, et al. “AFM-IR Investigation of Thin PECVD SiO x Films on a Polypropylene Substrate in the Surface-Sensitive Mode.” <i>Beilstein Journal of Nanotechnology</i>, vol. 15, no. 1, 2024, pp. 603–611, doi:<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>.","ieee":"H. Müller, H. Stadler, M. T. de los Arcos de Pedro, A. Keller, and G. Grundmeier, “AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode,” <i>Beilstein Journal of Nanotechnology</i>, vol. 15, no. 1, pp. 603–611, 2024, doi: <a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>.","short":"H. Müller, H. Stadler, M.T. de los Arcos de Pedro, A. Keller, G. Grundmeier, Beilstein Journal of Nanotechnology 15 (2024) 603–611."},"doi":"10.3762/bjnano.15.51","publication":"Beilstein Journal of Nanotechnology","status":"public","intvolume":"        15","date_updated":"2025-02-12T14:56:14Z","author":[{"last_name":"Müller","first_name":"Hendrik","full_name":"Müller, Hendrik"},{"last_name":"Stadler","first_name":"Hartmut","full_name":"Stadler, Hartmut"},{"first_name":"Maria Teresa","last_name":"de los Arcos de Pedro","id":"54556","orcid":"0000-0002-8684-273X ","full_name":"de los Arcos de Pedro, Maria Teresa"},{"orcid":"0000-0001-7139-3110","id":"48864","full_name":"Keller, Adrian","last_name":"Keller","first_name":"Adrian"},{"first_name":"Guido","last_name":"Grundmeier","full_name":"Grundmeier, Guido","id":"194"}],"department":[{"_id":"302"}],"issue":"1","date_created":"2025-02-12T14:48:49Z","language":[{"iso":"eng"}]}