{"main_file_link":[{"open_access":"1"}],"type":"journal_article","publisher":"Elsevier BV","publication_status":"published","external_id":{"pmid":["39823700"]},"intvolume":"       270","_id":"59177","citation":{"ama":"Zietlow C, Lindner J. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>. 2025;270. doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>","bibtex":"@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss EELS maps}, volume={270}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow, Christian and Lindner, Jörg}, year={2025} }","ieee":"C. Zietlow and J. Lindner, “An applied noise model for low-loss EELS maps,” <i>Ultramicroscopy</i>, vol. 270, Art. no. 114101, 2025, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","short":"C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).","apa":"Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>, <i>270</i>, Article 114101. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>","mla":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, vol. 270, 114101, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","chicago":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i> 270 (2025). <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>."},"volume":270,"article_number":"114101","year":"2025","publication":"Ultramicroscopy","author":[{"last_name":"Zietlow","full_name":"Zietlow, Christian","id":"77368","first_name":"Christian","orcid":"https://orcid.org/0000-0001-9696-619X"},{"full_name":"Lindner, Jörg","last_name":"Lindner","id":"20797","first_name":"Jörg"}],"publication_identifier":{"issn":["0304-3991"]},"user_id":"77368","date_created":"2025-03-28T06:58:55Z","title":"An applied noise model for low-loss EELS maps","doi":"10.1016/j.ultramic.2024.114101","pmid":"1","oa":"1","language":[{"iso":"eng"}],"quality_controlled":"1","date_updated":"2025-04-07T06:36:16Z","status":"public"}