[{"external_id":{"pmid":["39885260"]},"oa":"1","citation":{"apa":"Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. <i>Sci Rep</i>, <i>15</i>(1), 3815. <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">https://doi.org/10.1038/s41598-025-85982-4</a>","ieee":"C. Zietlow and J. Lindner, “An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.,” <i>Sci Rep</i>, vol. 15, no. 1, p. 3815, 2025, doi: <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>.","chicago":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i> 15, no. 1 (2025): 3815. <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">https://doi.org/10.1038/s41598-025-85982-4</a>.","short":"C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.","mla":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i>, vol. 15, no. 1, 2025, p. 3815, doi:<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>.","ama":"Zietlow C, Lindner J. An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. <i>Sci Rep</i>. 2025;15(1):3815. doi:<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>","bibtex":"@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.}, volume={15}, DOI={<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>}, number={1}, journal={Sci Rep}, author={Zietlow, Christian and Lindner, Jörg}, year={2025}, pages={3815} }"},"quality_controlled":"1","page":"3815","_id":"59178","user_id":"77368","volume":15,"status":"public","date_created":"2025-03-28T07:03:45Z","type":"journal_article","department":[{"_id":"15"}],"publication":"Sci Rep","issue":"1","main_file_link":[{"open_access":"1"}],"language":[{"iso":"eng"}],"pmid":"1","doi":"10.1038/s41598-025-85982-4","title":"An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.","year":"2025","author":[{"last_name":"Zietlow","orcid":"https://orcid.org/0000-0001-9696-619X","first_name":"Christian","full_name":"Zietlow, Christian","id":"77368"},{"last_name":"Lindner","first_name":"Jörg","full_name":"Lindner, Jörg","id":"20797"}],"publication_identifier":{"issn":["2045-2322"]},"date_updated":"2026-02-04T07:49:19Z","publication_status":"published","intvolume":"        15","article_type":"original"}]