{"status":"public","author":[{"full_name":"Güsken, Nicholas A.","last_name":"Güsken","first_name":"Nicholas A."},{"first_name":"Alberto","last_name":"Lauri","full_name":"Lauri, Alberto"},{"full_name":"Li, Yi","last_name":"Li","first_name":"Yi"},{"first_name":"Takayuki","full_name":"Matsui, Takayuki","last_name":"Matsui"},{"last_name":"Doiron","full_name":"Doiron, Brock","first_name":"Brock"},{"first_name":"Ryan","last_name":"Bower","full_name":"Bower, Ryan"},{"full_name":"Regoutz, Anna","last_name":"Regoutz","first_name":"Anna"},{"first_name":"Andrei","last_name":"Mihai","full_name":"Mihai, Andrei"},{"first_name":"Peter K.","last_name":"Petrov","full_name":"Petrov, Peter K."},{"full_name":"Oulton, Rupert F.","last_name":"Oulton","first_name":"Rupert F."},{"last_name":"Cohen","full_name":"Cohen, Lesley F.","first_name":"Lesley F."},{"first_name":"Stefan A.","full_name":"Maier, Stefan A.","last_name":"Maier"}],"publication_status":"published","doi":"10.1021/acsphotonics.8b01639","language":[{"iso":"eng"}],"date_updated":"2025-12-03T14:48:59Z","intvolume":"         6","date_created":"2025-04-10T13:21:56Z","volume":6,"type":"journal_article","publication_identifier":{"issn":["2330-4022","2330-4022"]},"_id":"59495","title":"TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions","citation":{"ieee":"N. A. Güsken <i>et al.</i>, “TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions,” <i>ACS Photonics</i>, vol. 6, no. 4, pp. 953–960, 2019, doi: <a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">10.1021/acsphotonics.8b01639</a>.","mla":"Güsken, Nicholas A., et al. “TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions.” <i>ACS Photonics</i>, vol. 6, no. 4, American Chemical Society (ACS), 2019, pp. 953–60, doi:<a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">10.1021/acsphotonics.8b01639</a>.","bibtex":"@article{Güsken_Lauri_Li_Matsui_Doiron_Bower_Regoutz_Mihai_Petrov_Oulton_et al._2019, title={TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions}, volume={6}, DOI={<a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">10.1021/acsphotonics.8b01639</a>}, number={4}, journal={ACS Photonics}, publisher={American Chemical Society (ACS)}, author={Güsken, Nicholas A. and Lauri, Alberto and Li, Yi and Matsui, Takayuki and Doiron, Brock and Bower, Ryan and Regoutz, Anna and Mihai, Andrei and Petrov, Peter K. and Oulton, Rupert F. and et al.}, year={2019}, pages={953–960} }","ama":"Güsken NA, Lauri A, Li Y, et al. TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions. <i>ACS Photonics</i>. 2019;6(4):953-960. doi:<a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">10.1021/acsphotonics.8b01639</a>","short":"N.A. Güsken, A. Lauri, Y. Li, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, ACS Photonics 6 (2019) 953–960.","chicago":"Güsken, Nicholas A., Alberto Lauri, Yi Li, Takayuki Matsui, Brock Doiron, Ryan Bower, Anna Regoutz, et al. “TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions.” <i>ACS Photonics</i> 6, no. 4 (2019): 953–60. <a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">https://doi.org/10.1021/acsphotonics.8b01639</a>.","apa":"Güsken, N. A., Lauri, A., Li, Y., Matsui, T., Doiron, B., Bower, R., Regoutz, A., Mihai, A., Petrov, P. K., Oulton, R. F., Cohen, L. F., &#38; Maier, S. A. (2019). TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions. <i>ACS Photonics</i>, <i>6</i>(4), 953–960. <a href=\"https://doi.org/10.1021/acsphotonics.8b01639\">https://doi.org/10.1021/acsphotonics.8b01639</a>"},"page":"953-960","year":"2019","issue":"4","publisher":"American Chemical Society (ACS)","publication":"ACS Photonics","user_id":"112030"}