TiO<sub>2–<i>x</i></sub>-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions
N.A. Güsken, A. Lauri, Y. Li, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, ACS Photonics 6 (2019) 953–960.