{"date_created":"2025-05-20T11:33:24Z","status":"public","doi":"10.1016/j.ultramic.2025.114159","publisher":"Elsevier","_id":"60001","issue":"275","language":[{"iso":"eng"}],"title":"An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps","publication":"Ultramicroscopy","date_updated":"2025-05-20T11:33:40Z","type":"journal_article","citation":{"ama":"Zietlow C, Lindner J. An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps. Ultramicroscopy. 2025;(275). doi:10.1016/j.ultramic.2025.114159","short":"C. Zietlow, J. Lindner, Ultramicroscopy (2025).","chicago":"Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the Deconvolution of STEM-EELS Maps.” Ultramicroscopy, no. 275 (2025). https://doi.org/10.1016/j.ultramic.2025.114159.","apa":"Zietlow, C., & Lindner, J. (2025). An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps. Ultramicroscopy, 275. https://doi.org/10.1016/j.ultramic.2025.114159","ieee":"C. Zietlow and J. Lindner, “An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps,” Ultramicroscopy, no. 275, 2025, doi: 10.1016/j.ultramic.2025.114159.","bibtex":"@article{Zietlow_Lindner_2025, title={An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps}, DOI={10.1016/j.ultramic.2025.114159}, number={275}, journal={Ultramicroscopy}, publisher={Elsevier}, author={Zietlow, Christian and Lindner, Jörg}, year={2025} }","mla":"Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the Deconvolution of STEM-EELS Maps.” Ultramicroscopy, no. 275, Elsevier, 2025, doi:10.1016/j.ultramic.2025.114159."},"user_id":"77496","year":"2025","author":[{"first_name":"Christian","id":"77368","orcid":"https://orcid.org/0000-0001-9696-619X","last_name":"Zietlow","full_name":"Zietlow, Christian"},{"last_name":"Lindner","full_name":"Lindner, Jörg","first_name":"Jörg","id":"20797"}],"department":[{"_id":"286"},{"_id":"15"}]}