{"publication_status":"published","year":"2025","citation":{"ama":"Schapeler T, Schlue F, Stefszky M, Brecht B, Silberhorn C, Bartley T. Optimizing photon-number resolution with superconducting nanowire multi-photon detectors. In: Itzler MA, McIntosh KA, Bienfang JC, eds. <i>Advanced Photon Counting Techniques XIX</i>. SPIE; 2025. doi:<a href=\"https://doi.org/10.1117/12.3054905\">10.1117/12.3054905</a>","ieee":"T. Schapeler, F. Schlue, M. Stefszky, B. Brecht, C. Silberhorn, and T. Bartley, “Optimizing photon-number resolution with superconducting nanowire multi-photon detectors,” in <i>Advanced Photon Counting Techniques XIX</i>, 2025, doi: <a href=\"https://doi.org/10.1117/12.3054905\">10.1117/12.3054905</a>.","chicago":"Schapeler, Timon, Fabian Schlue, Michael Stefszky, Benjamin Brecht, Christine Silberhorn, and Tim Bartley. “Optimizing Photon-Number Resolution with Superconducting Nanowire Multi-Photon Detectors.” In <i>Advanced Photon Counting Techniques XIX</i>, edited by Mark A. Itzler, K. Alex McIntosh, and Joshua C. Bienfang. SPIE, 2025. <a href=\"https://doi.org/10.1117/12.3054905\">https://doi.org/10.1117/12.3054905</a>.","mla":"Schapeler, Timon, et al. “Optimizing Photon-Number Resolution with Superconducting Nanowire Multi-Photon Detectors.” <i>Advanced Photon Counting Techniques XIX</i>, edited by Mark A. Itzler et al., SPIE, 2025, doi:<a href=\"https://doi.org/10.1117/12.3054905\">10.1117/12.3054905</a>.","bibtex":"@inproceedings{Schapeler_Schlue_Stefszky_Brecht_Silberhorn_Bartley_2025, title={Optimizing photon-number resolution with superconducting nanowire multi-photon detectors}, DOI={<a href=\"https://doi.org/10.1117/12.3054905\">10.1117/12.3054905</a>}, booktitle={Advanced Photon Counting Techniques XIX}, publisher={SPIE}, author={Schapeler, Timon and Schlue, Fabian and Stefszky, Michael and Brecht, Benjamin and Silberhorn, Christine and Bartley, Tim}, editor={Itzler, Mark A. and McIntosh, K. Alex and Bienfang, Joshua C.}, year={2025} }","short":"T. Schapeler, F. Schlue, M. Stefszky, B. Brecht, C. Silberhorn, T. Bartley, in: M.A. Itzler, K.A. McIntosh, J.C. Bienfang (Eds.), Advanced Photon Counting Techniques XIX, SPIE, 2025.","apa":"Schapeler, T., Schlue, F., Stefszky, M., Brecht, B., Silberhorn, C., &#38; Bartley, T. (2025). Optimizing photon-number resolution with superconducting nanowire multi-photon detectors. In M. A. Itzler, K. A. McIntosh, &#38; J. C. Bienfang (Eds.), <i>Advanced Photon Counting Techniques XIX</i>. SPIE. <a href=\"https://doi.org/10.1117/12.3054905\">https://doi.org/10.1117/12.3054905</a>"},"date_updated":"2025-07-11T09:22:11Z","publisher":"SPIE","date_created":"2025-07-11T09:18:09Z","author":[{"first_name":"Timon","orcid":"0000-0001-7652-1716","last_name":"Schapeler","id":"55629","full_name":"Schapeler, Timon"},{"full_name":"Schlue, Fabian","id":"63579","last_name":"Schlue","first_name":"Fabian"},{"last_name":"Stefszky","full_name":"Stefszky, Michael","id":"42777","first_name":"Michael"},{"first_name":"Benjamin","orcid":"0000-0003-4140-0556 ","last_name":"Brecht","full_name":"Brecht, Benjamin","id":"27150"},{"first_name":"Christine","id":"26263","full_name":"Silberhorn, Christine","last_name":"Silberhorn"},{"last_name":"Bartley","id":"49683","full_name":"Bartley, Tim","first_name":"Tim"}],"title":"Optimizing photon-number resolution with superconducting nanowire multi-photon detectors","doi":"10.1117/12.3054905","publication":"Advanced Photon Counting Techniques XIX","type":"conference","editor":[{"full_name":"Itzler, Mark A.","last_name":"Itzler","first_name":"Mark A."},{"first_name":"K. Alex","full_name":"McIntosh, K. Alex","last_name":"McIntosh"},{"first_name":"Joshua C.","full_name":"Bienfang, Joshua C.","last_name":"Bienfang"}],"status":"public","_id":"60587","project":[{"name":"QuESADILLA: ERC-Grant: QuESADILLA: Quantum Engineering Superconducting Array Detectors in Low-Light Applications","_id":"239","grant_number":"101042399","call_identifier":"ERC"},{"grant_number":"13N16103","_id":"191","name":"PhoQuant--QCTest: PhoQuant: Photonische Quantencomputer -  Quantencomputing Testplattform"}],"department":[{"_id":"15"},{"_id":"623"}],"user_id":"55629","language":[{"iso":"eng"}]}