{"title":"IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions","citation":{"bibtex":"@article{Güsken_Lauri_Li_Jacassi_Matsui_Doiron_Bower_Regoutz_Mihai_Petrov_et al._2020, title={IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions}, volume={5}, DOI={<a href=\"https://doi.org/10.1557/adv.2020.129\">10.1557/adv.2020.129</a>}, number={35–36}, journal={MRS Advances}, publisher={Springer Science and Business Media LLC}, author={Güsken, Nicholas Alexander and Lauri, Alberto and Li, Yi and Jacassi, Andrea and Matsui, Takayuki and Doiron, Brock and Bower, Ryan and Regoutz, Anna and Mihai, Andrei and Petrov, Peter K. and et al.}, year={2020}, pages={1843–1850} }","ieee":"N. A. Güsken <i>et al.</i>, “IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions,” <i>MRS Advances</i>, vol. 5, no. 35–36, pp. 1843–1850, 2020, doi: <a href=\"https://doi.org/10.1557/adv.2020.129\">10.1557/adv.2020.129</a>.","mla":"Güsken, Nicholas Alexander, et al. “IR Hot Carrier Based Photodetection in Titanium Nitride Oxide Thin Film-Si Junctions.” <i>MRS Advances</i>, vol. 5, no. 35–36, Springer Science and Business Media LLC, 2020, pp. 1843–50, doi:<a href=\"https://doi.org/10.1557/adv.2020.129\">10.1557/adv.2020.129</a>.","apa":"Güsken, N. A., Lauri, A., Li, Y., Jacassi, A., Matsui, T., Doiron, B., Bower, R., Regoutz, A., Mihai, A., Petrov, P. K., Oulton, R. F., Cohen, L. F., &#38; Maier, S. A. (2020). IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. <i>MRS Advances</i>, <i>5</i>(35–36), 1843–1850. <a href=\"https://doi.org/10.1557/adv.2020.129\">https://doi.org/10.1557/adv.2020.129</a>","chicago":"Güsken, Nicholas Alexander, Alberto Lauri, Yi Li, Andrea Jacassi, Takayuki Matsui, Brock Doiron, Ryan Bower, et al. “IR Hot Carrier Based Photodetection in Titanium Nitride Oxide Thin Film-Si Junctions.” <i>MRS Advances</i> 5, no. 35–36 (2020): 1843–50. <a href=\"https://doi.org/10.1557/adv.2020.129\">https://doi.org/10.1557/adv.2020.129</a>.","short":"N.A. Güsken, A. Lauri, Y. Li, A. Jacassi, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, MRS Advances 5 (2020) 1843–1850.","ama":"Güsken NA, Lauri A, Li Y, et al. IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. <i>MRS Advances</i>. 2020;5(35-36):1843-1850. doi:<a href=\"https://doi.org/10.1557/adv.2020.129\">10.1557/adv.2020.129</a>"},"_id":"63046","year":"2020","page":"1843-1850","issue":"35-36","user_id":"112030","publication":"MRS Advances","publisher":"Springer Science and Business Media LLC","author":[{"last_name":"Güsken","orcid":"0000-0002-4816-0666","full_name":"Güsken, Nicholas Alexander","first_name":"Nicholas Alexander","id":"112030"},{"first_name":"Alberto","last_name":"Lauri","full_name":"Lauri, Alberto"},{"first_name":"Yi","last_name":"Li","full_name":"Li, Yi"},{"full_name":"Jacassi, Andrea","last_name":"Jacassi","first_name":"Andrea"},{"first_name":"Takayuki","last_name":"Matsui","full_name":"Matsui, Takayuki"},{"first_name":"Brock","last_name":"Doiron","full_name":"Doiron, Brock"},{"first_name":"Ryan","full_name":"Bower, Ryan","last_name":"Bower"},{"first_name":"Anna","last_name":"Regoutz","full_name":"Regoutz, Anna"},{"first_name":"Andrei","full_name":"Mihai, Andrei","last_name":"Mihai"},{"last_name":"Petrov","full_name":"Petrov, Peter K.","first_name":"Peter K."},{"first_name":"Rupert F.","last_name":"Oulton","full_name":"Oulton, Rupert F."},{"full_name":"Cohen, Lesley F.","last_name":"Cohen","first_name":"Lesley F."},{"full_name":"Maier, Stefan A.","last_name":"Maier","first_name":"Stefan A."}],"status":"public","department":[{"_id":"623"},{"_id":"15"},{"_id":"230"}],"publication_status":"published","doi":"10.1557/adv.2020.129","language":[{"iso":"eng"}],"date_updated":"2025-12-15T11:21:37Z","date_created":"2025-12-11T20:38:45Z","intvolume":"         5","publication_identifier":{"issn":["2059-8521"]},"type":"journal_article","volume":5}