IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions
N.A. Güsken, A. Lauri, Y. Li, A. Jacassi, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, MRS Advances 5 (2020) 1843–1850.