{"doi":"10.3390/s23031348","language":[{"iso":"eng"}],"status":"public","author":[{"last_name":"Johannsmann","full_name":"Johannsmann, Diethelm","first_name":"Diethelm"},{"last_name":"Langhoff","full_name":"Langhoff, Arne","first_name":"Arne"},{"full_name":"Leppin, Christian","last_name":"Leppin","id":"117722","first_name":"Christian"},{"first_name":"Ilya","last_name":"Reviakine","full_name":"Reviakine, Ilya"},{"full_name":"Maan, Anna M. C.","last_name":"Maan","first_name":"Anna M. C."}],"volume":23,"type":"journal_article","date_created":"2025-12-18T17:05:00Z","year":"2023","_id":"63230","citation":{"bibtex":"@article{Johannsmann_Langhoff_Leppin_Reviakine_Maan_2023, title={Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model}, volume={23}, DOI={<a href=\"https://doi.org/10.3390/s23031348\">10.3390/s23031348</a>}, number={31348}, journal={Sensors}, publisher={MDPI AG}, author={Johannsmann, Diethelm and Langhoff, Arne and Leppin, Christian and Reviakine, Ilya and Maan, Anna M. C.}, year={2023} }","ieee":"D. Johannsmann, A. Langhoff, C. Leppin, I. Reviakine, and A. M. C. Maan, “Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model,” <i>Sensors</i>, vol. 23, no. 3, Art. no. 1348, 2023, doi: <a href=\"https://doi.org/10.3390/s23031348\">10.3390/s23031348</a>.","mla":"Johannsmann, Diethelm, et al. “Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model.” <i>Sensors</i>, vol. 23, no. 3, 1348, MDPI AG, 2023, doi:<a href=\"https://doi.org/10.3390/s23031348\">10.3390/s23031348</a>.","chicago":"Johannsmann, Diethelm, Arne Langhoff, Christian Leppin, Ilya Reviakine, and Anna M. C. Maan. “Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model.” <i>Sensors</i> 23, no. 3 (2023). <a href=\"https://doi.org/10.3390/s23031348\">https://doi.org/10.3390/s23031348</a>.","apa":"Johannsmann, D., Langhoff, A., Leppin, C., Reviakine, I., &#38; Maan, A. M. C. (2023). Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model. <i>Sensors</i>, <i>23</i>(3), Article 1348. <a href=\"https://doi.org/10.3390/s23031348\">https://doi.org/10.3390/s23031348</a>","short":"D. Johannsmann, A. Langhoff, C. Leppin, I. Reviakine, A.M.C. Maan, Sensors 23 (2023).","ama":"Johannsmann D, Langhoff A, Leppin C, Reviakine I, Maan AMC. Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model. <i>Sensors</i>. 2023;23(3). doi:<a href=\"https://doi.org/10.3390/s23031348\">10.3390/s23031348</a>"},"publication":"Sensors","issue":"3","publication_status":"published","quality_controlled":"1","abstract":[{"lang":"eng","text":"<jats:p>Quartz crystal microbalance with dissipation monitoring (QCM-D) is a well-established technique for studying soft films. It can provide gravimetric as well as nongravimetric information about a film, such as its thickness and mechanical properties. The interpretation of sets of overtone-normalized frequency shifts, ∆f/n, and overtone-normalized shifts in half-bandwidth, ΔΓ/n, provided by QCM-D relies on a model that, in general, contains five independent parameters that are needed to describe film thickness and frequency-dependent viscoelastic properties. Here, we examine how noise inherent in experimental data affects the determination of these parameters. There are certain conditions where noise prevents the reliable determination of film thickness and the loss tangent. On the other hand, we show that there are conditions where it is possible to determine all five parameters. We relate these conditions to the mathematical properties of the model in terms of simple conceptual diagrams that can help users understand the model’s behavior. Finally, we present new open source software for QCM-D data analysis written in Python, PyQTM.</jats:p>"}],"extern":"1","publication_identifier":{"issn":["1424-8220"]},"intvolume":"        23","date_updated":"2025-12-18T17:39:52Z","title":"Effect of Noise on Determining Ultrathin-Film Parameters from QCM-D Data with the Viscoelastic Model","publisher":"MDPI AG","user_id":"117722","article_number":"1348"}