{"status":"public","publication":"IEEE Transactions on Technology and Society","type":"journal_article","language":[{"iso":"eng"}],"_id":"64193","user_id":"97123","year":"2024","intvolume":" 5","page":"93-106","citation":{"apa":"Xu, Y., Terhörst, P., Pedersen, M., & Raja, K. (2024). Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. IEEE Transactions on Technology and Society, 5(1), 93–106. https://doi.org/10.1109/tts.2024.3365421","mla":"Xu, Ying, et al. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” IEEE Transactions on Technology and Society, vol. 5, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2024, pp. 93–106, doi:10.1109/tts.2024.3365421.","short":"Y. Xu, P. Terhörst, M. Pedersen, K. Raja, IEEE Transactions on Technology and Society 5 (2024) 93–106.","bibtex":"@article{Xu_Terhörst_Pedersen_Raja_2024, title={Analyzing Fairness in Deepfake Detection With Massively Annotated Databases}, volume={5}, DOI={10.1109/tts.2024.3365421}, number={1}, journal={IEEE Transactions on Technology and Society}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Xu, Ying and Terhörst, Philipp and Pedersen, Marius and Raja, Kiran}, year={2024}, pages={93–106} }","ama":"Xu Y, Terhörst P, Pedersen M, Raja K. Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. IEEE Transactions on Technology and Society. 2024;5(1):93-106. doi:10.1109/tts.2024.3365421","chicago":"Xu, Ying, Philipp Terhörst, Marius Pedersen, and Kiran Raja. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” IEEE Transactions on Technology and Society 5, no. 1 (2024): 93–106. https://doi.org/10.1109/tts.2024.3365421.","ieee":"Y. Xu, P. Terhörst, M. Pedersen, and K. Raja, “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases,” IEEE Transactions on Technology and Society, vol. 5, no. 1, pp. 93–106, 2024, doi: 10.1109/tts.2024.3365421."},"publication_identifier":{"issn":["2637-6415"]},"publication_status":"published","issue":"1","title":"Analyzing Fairness in Deepfake Detection With Massively Annotated Databases","doi":"10.1109/tts.2024.3365421","date_updated":"2026-02-19T07:50:47Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","volume":5,"author":[{"last_name":"Xu","full_name":"Xu, Ying","first_name":"Ying"},{"last_name":"Terhörst","full_name":"Terhörst, Philipp","id":"97123","first_name":"Philipp"},{"last_name":"Pedersen","full_name":"Pedersen, Marius","first_name":"Marius"},{"last_name":"Raja","full_name":"Raja, Kiran","first_name":"Kiran"}],"date_created":"2026-02-18T09:32:05Z"}