conference paper published Jonas Lick author Fiona Kattenstroth author Hendrik van der Valk author Malte Trienens author Arno Kühn author Roman Dumitrescu author 16190 563 department IEEE2026 eng 10.1109/wsc68292.2025.11338979 Lick J, Kattenstroth F, van der Valk H, Trienens M, Kühn A, Dumitrescu R. Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry. In: <i>2025 Winter Simulation Conference (WSC)</i>. IEEE; 2026. doi:<a href="https://doi.org/10.1109/wsc68292.2025.11338979">10.1109/wsc68292.2025.11338979</a> Lick, J., Kattenstroth, F., van der Valk, H., Trienens, M., Kühn, A., &#38; Dumitrescu, R. (2026). Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry. <i>2025 Winter Simulation Conference (WSC)</i>. <a href="https://doi.org/10.1109/wsc68292.2025.11338979">https://doi.org/10.1109/wsc68292.2025.11338979</a> Lick, Jonas, Fiona Kattenstroth, Hendrik van der Valk, Malte Trienens, Arno Kühn, and Roman Dumitrescu. “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry.” In <i>2025 Winter Simulation Conference (WSC)</i>. IEEE, 2026. <a href="https://doi.org/10.1109/wsc68292.2025.11338979">https://doi.org/10.1109/wsc68292.2025.11338979</a>. J. Lick, F. Kattenstroth, H. van der Valk, M. Trienens, A. Kühn, and R. Dumitrescu, “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry,” 2026, doi: <a href="https://doi.org/10.1109/wsc68292.2025.11338979">10.1109/wsc68292.2025.11338979</a>. Lick, Jonas, et al. “Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry.” <i>2025 Winter Simulation Conference (WSC)</i>, IEEE, 2026, doi:<a href="https://doi.org/10.1109/wsc68292.2025.11338979">10.1109/wsc68292.2025.11338979</a>. @inproceedings{Lick_Kattenstroth_van der Valk_Trienens_Kühn_Dumitrescu_2026, title={Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry}, DOI={<a href="https://doi.org/10.1109/wsc68292.2025.11338979">10.1109/wsc68292.2025.11338979</a>}, booktitle={2025 Winter Simulation Conference (WSC)}, publisher={IEEE}, author={Lick, Jonas and Kattenstroth, Fiona and van der Valk, Hendrik and Trienens, Malte and Kühn, Arno and Dumitrescu, Roman}, year={2026} } J. Lick, F. Kattenstroth, H. van der Valk, M. Trienens, A. Kühn, R. Dumitrescu, in: 2025 Winter Simulation Conference (WSC), IEEE, 2026. 642212026-02-19T08:56:31Z2026-02-19T09:00:37Z