{"status":"public","publication":"Adaptive Optics: Analysis, Methods & Systems","type":"journal_article","language":[{"iso":"eng"}],"_id":"64421","department":[{"_id":"977"}],"user_id":"15911","year":"2016","citation":{"mla":"Göring, Lena, et al. “Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen.” <i>Adaptive Optics: Analysis, Methods &#38; Systems</i>, 2016, doi:<a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">10.1364/3d.2016.jw4a.40</a>.","short":"L. Göring, M. Finkeldey, N.C. Gerhardt, M.R. Hofmann, Adaptive Optics: Analysis, Methods &#38; Systems (2016).","bibtex":"@article{Göring_Finkeldey_Gerhardt_Hofmann_2016, title={Common-path digital holography microscopy of buried semiconductor specimen}, DOI={<a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">10.1364/3d.2016.jw4a.40</a>}, journal={Adaptive Optics: Analysis, Methods &#38; Systems}, author={Göring, Lena and Finkeldey, Markus and Gerhardt, Nils Christopher and Hofmann, Martin R.}, year={2016} }","apa":"Göring, L., Finkeldey, M., Gerhardt, N. C., &#38; Hofmann, M. R. (2016). Common-path digital holography microscopy of buried semiconductor specimen. <i>Adaptive Optics: Analysis, Methods &#38; Systems</i>. <a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">https://doi.org/10.1364/3d.2016.jw4a.40</a>","ama":"Göring L, Finkeldey M, Gerhardt NC, Hofmann MR. Common-path digital holography microscopy of buried semiconductor specimen. <i>Adaptive Optics: Analysis, Methods &#38; Systems</i>. Published online 2016. doi:<a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">10.1364/3d.2016.jw4a.40</a>","chicago":"Göring, Lena, Markus Finkeldey, Nils Christopher Gerhardt, and Martin R. Hofmann. “Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen.” <i>Adaptive Optics: Analysis, Methods &#38; Systems</i>, 2016. <a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">https://doi.org/10.1364/3d.2016.jw4a.40</a>.","ieee":"L. Göring, M. Finkeldey, N. C. Gerhardt, and M. R. Hofmann, “Common-path digital holography microscopy of buried semiconductor specimen,” <i>Adaptive Optics: Analysis, Methods &#38; Systems</i>, 2016, doi: <a href=\"https://doi.org/10.1364/3d.2016.jw4a.40\">10.1364/3d.2016.jw4a.40</a>."},"title":"Common-path digital holography microscopy of buried semiconductor specimen","doi":"10.1364/3d.2016.jw4a.40","date_updated":"2026-02-25T10:08:07Z","date_created":"2026-02-20T10:04:12Z","author":[{"first_name":"Lena","last_name":"Göring","full_name":"Göring, Lena"},{"first_name":"Markus","last_name":"Finkeldey","full_name":"Finkeldey, Markus"},{"first_name":"Nils Christopher","orcid":"0009-0002-5538-231X","last_name":"Gerhardt","id":"115298","full_name":"Gerhardt, Nils Christopher"},{"first_name":"Martin R.","last_name":"Hofmann","full_name":"Hofmann, Martin R."}]}