{"page":"1 - 11","citation":{"ieee":"M. Breede, C. Kasseck, C. (ORCiD: 0000-0002-8764-9261) Brenner, N. C. Gerhardt, M. Hofmann, and R. Höfling, “External-cavity diode laser utilizing a micromirror device for spectral tuning,” in Optical measurement systems for industrial inspection V, 2007, pp. 1–11, doi: 10.1117/12.726825.","chicago":"Breede, Martin, Christoph Kasseck, Carsten (ORCiD: 0000-0002-8764-9261) Brenner, Nils Christopher Gerhardt, Martin Hofmann, and Roland Höfling. “External-Cavity Diode Laser Utilizing a Micromirror Device for Spectral Tuning.” In Optical Measurement Systems for Industrial Inspection V, 1–11, 2007. https://doi.org/10.1117/12.726825.","ama":"Breede M, Kasseck C, Brenner C (ORCiD: 0000-0002-8764-9261), Gerhardt NC, Hofmann M, Höfling R. External-cavity diode laser utilizing a micromirror device for spectral tuning. In: Optical Measurement Systems for Industrial Inspection V. ; 2007:1-11. doi:10.1117/12.726825","apa":"Breede, M., Kasseck, C., Brenner, C. (ORCiD: 0000-0002-8764-9261), Gerhardt, N. C., Hofmann, M., & Höfling, R. (2007). External-cavity diode laser utilizing a micromirror device for spectral tuning. Optical Measurement Systems for Industrial Inspection V, 1–11. https://doi.org/10.1117/12.726825","bibtex":"@inproceedings{Breede_Kasseck_Brenner_Gerhardt_Hofmann_Höfling_2007, title={External-cavity diode laser utilizing a micromirror device for spectral tuning}, DOI={10.1117/12.726825}, booktitle={Optical measurement systems for industrial inspection V}, author={Breede, Martin and Kasseck, Christoph and Brenner, Carsten (ORCiD: 0000-0002-8764-9261) and Gerhardt, Nils Christopher and Hofmann, Martin and Höfling, Roland}, year={2007}, pages={1–11} }","short":"M. Breede, C. Kasseck, C. (ORCiD: 0000-0002-8764-9261) Brenner, N.C. Gerhardt, M. Hofmann, R. Höfling, in: Optical Measurement Systems for Industrial Inspection V, 2007, pp. 1–11.","mla":"Breede, Martin, et al. “External-Cavity Diode Laser Utilizing a Micromirror Device for Spectral Tuning.” Optical Measurement Systems for Industrial Inspection V, 2007, pp. 1–11, doi:10.1117/12.726825."},"year":"2007","author":[{"first_name":"Martin","full_name":"Breede, Martin","last_name":"Breede"},{"first_name":"Christoph","last_name":"Kasseck","full_name":"Kasseck, Christoph"},{"first_name":"Carsten (ORCiD: 0000-0002-8764-9261)","last_name":"Brenner","full_name":"Brenner, Carsten (ORCiD: 0000-0002-8764-9261)"},{"id":"115298","full_name":"Gerhardt, Nils Christopher","last_name":"Gerhardt","orcid":"0009-0002-5538-231X","first_name":"Nils Christopher"},{"first_name":"Martin","full_name":"Hofmann, Martin","last_name":"Hofmann"},{"last_name":"Höfling","full_name":"Höfling, Roland","first_name":"Roland"}],"date_created":"2026-02-20T10:04:31Z","date_updated":"2026-02-20T10:38:15Z","doi":"10.1117/12.726825","title":"External-cavity diode laser utilizing a micromirror device for spectral tuning","publication":"Optical measurement systems for industrial inspection V","type":"conference","status":"public","department":[{"_id":"977"}],"user_id":"15911","_id":"64527","language":[{"iso":"eng"}]}