{"year":"2026","place":"Florianopolis, Brazil","citation":{"apa":"Jafarzadeh, H., Reimer, J. D., Amrouch, H., Hellebrand, S., &#38; Wunderlich, H.-J. (2026). Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG. <i>To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026</i>.","bibtex":"@inproceedings{Jafarzadeh_Reimer_Amrouch_Hellebrand_Wunderlich_2026, place={Florianopolis, Brazil}, title={Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG}, booktitle={To appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026}, author={Jafarzadeh, Hanieh and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2026} }","short":"H. Jafarzadeh, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026, Florianopolis, Brazil, 2026.","mla":"Jafarzadeh, Hanieh, et al. “Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG.” <i>To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026</i>, 2026.","ama":"Jafarzadeh H, Reimer JD, Amrouch H, Hellebrand S, Wunderlich H-J. Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG. In: <i>To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026</i>. ; 2026.","chicago":"Jafarzadeh, Hanieh, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG.” In <i>To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026</i>. Florianopolis, Brazil, 2026.","ieee":"H. Jafarzadeh, J. D. Reimer, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG,” 2026."},"date_updated":"2026-03-04T15:50:59Z","author":[{"full_name":"Jafarzadeh, Hanieh","last_name":"Jafarzadeh","first_name":"Hanieh"},{"first_name":"Jan Dennis","last_name":"Reimer","id":"36703","full_name":"Reimer, Jan Dennis"},{"full_name":"Amrouch, Hussam","last_name":"Amrouch","first_name":"Hussam"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"date_created":"2026-03-04T15:44:27Z","title":"Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG","publication":"To appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026","type":"conference","status":"public","_id":"64838","department":[{"_id":"48"}],"user_id":"36703","language":[{"iso":"eng"}]}