An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores

conference paper An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores published Tijmen T. Smit author Bruno Endres Forlin author Kuan-Hsun Chen author Ioanna Souvatzoglou author Mihalis Psarakis author Marco Ottavi author IEEE2024 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/dft63277.2024.10753564 Smit TT, Forlin BE, Chen K-H, Souvatzoglou I, Psarakis M, Ottavi M. An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores. In: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE; 2024. doi:<a href="https://doi.org/10.1109/dft63277.2024.10753564">10.1109/dft63277.2024.10753564</a> @inproceedings{Smit_Forlin_Chen_Souvatzoglou_Psarakis_Ottavi_2024, title={An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores}, DOI={<a href="https://doi.org/10.1109/dft63277.2024.10753564">10.1109/dft63277.2024.10753564</a>}, booktitle={2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)}, publisher={IEEE}, author={Smit, Tijmen T. and Forlin, Bruno Endres and Chen, Kuan-Hsun and Souvatzoglou, Ioanna and Psarakis, Mihalis and Ottavi, Marco}, year={2024} } Smit, Tijmen T., et al. “An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores.” 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, 2024, doi:<a href="https://doi.org/10.1109/dft63277.2024.10753564">10.1109/dft63277.2024.10753564</a>. T.T. Smit, B.E. Forlin, K.-H. Chen, I. Souvatzoglou, M. Psarakis, M. Ottavi, in: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, 2024. Smit, Tijmen T., Bruno Endres Forlin, Kuan-Hsun Chen, Ioanna Souvatzoglou, Mihalis Psarakis, and Marco Ottavi. “An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores.” In 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, 2024. <a href="https://doi.org/10.1109/dft63277.2024.10753564">https://doi.org/10.1109/dft63277.2024.10753564</a>. Smit, T. T., Forlin, B. E., Chen, K.-H., Souvatzoglou, I., Psarakis, M., & Ottavi, M. (2024). An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores. 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). <a href="https://doi.org/10.1109/dft63277.2024.10753564">https://doi.org/10.1109/dft63277.2024.10753564</a> T. T. Smit, B. E. Forlin, K.-H. Chen, I. Souvatzoglou, M. Psarakis, and M. Ottavi, “An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores,” 2024, doi: <a href="https://doi.org/10.1109/dft63277.2024.10753564">10.1109/dft63277.2024.10753564</a>. 661702026-07-03T21:11:54Z2026-07-05T14:48:07Z